{"id":495491,"date":"2026-06-02T10:00:26","date_gmt":"2026-06-02T08:00:26","guid":{"rendered":"https:\/\/www.ecinews.fr\/?p=495491"},"modified":"2026-06-02T00:18:27","modified_gmt":"2026-06-01T22:18:27","slug":"rohde-schwarz-presente-ses-solutions-de-test-avancees-pour-lelectronique-de-puissance-au-pcim-2026","status":"publish","type":"post","link":"https:\/\/www.ecinews.fr\/fr\/rohde-schwarz-presente-ses-solutions-de-test-avancees-pour-lelectronique-de-puissance-au-pcim-2026\/","title":{"rendered":"Rohde &#038; Schwarz pr\u00e9sente ses solutions de test avanc\u00e9es pour l\u2019\u00e9lectronique de puissance au PCIM 2026"},"content":{"rendered":"<p>\u00c0 l\u2019occasion du PCIM Expo 2026 qui se tient du 9 au 11 juin \u00e0 Nuremberg, Rohde &amp; Schwarz met en avant ses derni\u00e8res solutions de test et mesure d\u00e9di\u00e9es \u00e0 l\u2019\u00e9lectronique de puissance. Ces technologies r\u00e9pondent aux exigences croissantes li\u00e9es aux dispositifs SiC et GaN, au c\u0153ur des applications modernes telles que les data centers IA, les \u00e9nergies renouvelables et la mobilit\u00e9 \u00e9lectrique.<\/p>\n<p>Face \u00e0 la mont\u00e9e en puissance des architectures haute densit\u00e9, la capacit\u00e9 \u00e0 caract\u00e9riser pr\u00e9cis\u00e9ment les performances \u00e9lectriques devient un enjeu strat\u00e9gique pour les ing\u00e9nieurs.<\/p>\n<h4>Une analyse avanc\u00e9e des syst\u00e8mes triphas\u00e9s<\/h4>\n<p>Rohde &amp; Schwarz introduit une nouvelle option d\u2019analyse de puissance triphas\u00e9e (R&amp;S MXO\u2011K333) pour les oscilloscopes de la s\u00e9rie MXO. Cette solution transforme l\u2019oscilloscope en un outil complet de caract\u00e9risation des syst\u00e8mes AC multiphas\u00e9s.<\/p>\n<p>Gr\u00e2ce \u00e0 une configuration assist\u00e9e, les ing\u00e9nieurs peuvent rapidement mettre en place des mesures sur des syst\u00e8mes complexes, incluant des calculs de puissance, des analyses harmoniques et des mesures de distorsion conformes \u00e0 la norme IEC 61000\u20113\u20112. L\u2019int\u00e9gration de la visualisation des formes d\u2019onde permet \u00e9galement une identification rapide des ph\u00e9nom\u00e8nes transitoires.<\/p>\n<h4>Optimisation des cha\u00eenes de traction \u00e9lectrique<\/h4>\n<p>Le constructeur pr\u00e9sente \u00e9galement l\u2019analyseur de puissance LMG671, con\u00e7u pour mesurer avec pr\u00e9cision l\u2019efficacit\u00e9 des syst\u00e8mes de propulsion \u00e9lectrique.<\/p>\n<p>Cette solution permet de quantifier les pertes, d\u2019analyser les composantes fr\u00e9quentielles des signaux et d\u2019\u00e9valuer simultan\u00e9ment la puissance \u00e9lectrique et m\u00e9canique. Elle offre ainsi une vision compl\u00e8te des performances des syst\u00e8mes d\u2019entra\u00eenement, essentielle pour l\u2019optimisation des architectures de mobilit\u00e9 \u00e9lectrique.<\/p>\n<h4>Test double impulsion pour les dispositifs SiC et GaN<\/h4>\n<p>En collaboration avec PE\u2011Systems, Rohde &amp; Schwarz met en \u0434\u0435\u043c\u043e\u043dstration un syst\u00e8me automatis\u00e9 de test double impulsion, utilis\u00e9 pour caract\u00e9riser le comportement dynamique des dispositifs de puissance.<\/p>\n<p>Bas\u00e9 sur l\u2019oscilloscope MXO58 et les sondes isol\u00e9es RT\u2011ZISO, ce syst\u00e8me permet d\u2019analyser avec pr\u00e9cision les ph\u00e9nom\u00e8nes de commutation. L\u2019automatisation des mesures et l\u2019extraction des param\u00e8tres r\u00e9duisent les erreurs humaines et acc\u00e9l\u00e8rent les cycles de d\u00e9veloppement.<\/p>\n<h4>Une plateforme de test adapt\u00e9e aux nouvelles architectures de puissance<\/h4>\n<p>Ces solutions s\u2019inscrivent dans une d\u00e9marche globale visant \u00e0 accompagner les ing\u00e9nieurs dans l\u2019optimisation des performances des syst\u00e8mes bas\u00e9s sur les technologies WBG. Elles permettent d\u2019am\u00e9liorer l\u2019efficacit\u00e9 \u00e9nerg\u00e9tique, la fiabilit\u00e9 et la rapidit\u00e9 de conception.<\/p>\n<p><em>Pour les ing\u00e9nieurs en \u00e9lectronique de puissance, cette pr\u00e9sentation illustre l\u2019importance croissante du test avanc\u00e9 dans l\u2019exploitation des technologies SiC et GaN. Des outils de mesure pr\u00e9cis deviennent indispensables pour optimiser les performances et fiabiliser les syst\u00e8mes de nouvelle g\u00e9n\u00e9ration.<\/em><\/p>\n<p><a href=\"https:\/\/www.rohde-schwarz.com\/\">Rohde &amp; Schwarz<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>\u00c0 l\u2019occasion du PCIM Expo 2026 qui se tient du 9 au 11 juin \u00e0 Nuremberg, Rohde &amp; Schwarz met en avant ses derni\u00e8res solutions de test et mesure d\u00e9di\u00e9es \u00e0 l\u2019\u00e9lectronique de puissance. Ces technologies r\u00e9pondent aux exigences croissantes li\u00e9es aux dispositifs SiC et GaN, au c\u0153ur des applications modernes telles que les data [&hellip;]<\/p>\n","protected":false},"author":39,"featured_media":495508,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[881],"tags":[9574,11304,4015,6157],"domains":[47],"ppma_author":[6113],"class_list":["post-495491","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-nouveaux-produits","tag-pcim","tag-pcim-europe","tag-test-mesure","tag-test-mesures","domains-electronique-eci"],"acf":[],"yoast_head":"<title>Rohde &amp; Schwarz pr\u00e9sente ses solutions de test avanc\u00e9es pour ...<\/title>\n<meta name=\"description\" content=\"\u00c0 l\u2019occasion du PCIM Expo 2026 qui se tient du 9 au 11 juin \u00e0 Nuremberg, Rohde &amp; Schwarz met en avant ses derni\u00e8res solutions de test et mesure...\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts\/495491\/\" \/>\n<meta property=\"og:locale\" content=\"fr_FR\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Rohde &amp; 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