{"id":488108,"date":"2025-11-15T09:35:31","date_gmt":"2025-11-15T08:35:31","guid":{"rendered":"https:\/\/www.ecinews.fr\/?p=488108"},"modified":"2025-11-15T09:35:31","modified_gmt":"2025-11-15T08:35:31","slug":"nxp-ajoute-le-sie-a-la-gestion-des-batteries-des-ve","status":"publish","type":"post","link":"https:\/\/www.ecinews.fr\/fr\/nxp-ajoute-le-sie-a-la-gestion-des-batteries-des-ve\/","title":{"rendered":"NXP ajoute le SIE \u00e0 la gestion des batteries des VE"},"content":{"rendered":"

NXP Semiconductors a mis sur le march\u00e9 un jeu de puces de gestion de batterie<\/a> qui int\u00e8gre la spectroscopie d’imp\u00e9dance \u00e9lectrochimique (EIS) directement dans son mat\u00e9riel. Cette technologie permet un diagnostic synchronis\u00e9 des cellules dans l’ensemble de la batterie, ce qui pourrait am\u00e9liorer la s\u00e9curit\u00e9, le contr\u00f4le de la charge et les performances \u00e0 long terme des v\u00e9hicules \u00e9lectriques et des syst\u00e8mes de stockage stationnaires.<\/p>\n

Pour les lecteurs d’ECInews, cela est important car la surveillance bas\u00e9e sur le SIE devient un domaine de d\u00e9veloppement actif parmi les constructeurs automobiles europ\u00e9ens et les fournisseurs de niveau 1 \u00e0 la recherche d’analyses pr\u00e9dictives de l’\u00e9tat des batteries et d’une certification plus rapide des syst\u00e8mes \u00e0 haute tension.<\/p>\n

Int\u00e9gration de l’analyse d’imp\u00e9dance dans le BMS<\/h2>\n

Le jeu de puces combine trois composants – le capteur de cellule BMA7418, la passerelle BMA6402 et le contr\u00f4leur de bo\u00eete de jonction de batterie BMA8420 – tous con\u00e7us pour une synchronisation \u00e0 l’\u00e9chelle de la nanoseconde. Ensemble, ils effectuent des mesures d’imp\u00e9dance en temps r\u00e9el sans instrumentation externe.<\/p>\n

Un g\u00e9n\u00e9rateur de signaux int\u00e9gr\u00e9 \u00e0 la puce pr\u00e9charge le circuit haute tension et applique un signal d’excitation qui permet aux condensateurs de liaison CC d’agir comme un r\u00e9servoir d’\u00e9nergie secondaire. Selon NXP<\/a>, cet arrangement peut capturer les r\u00e9ponses dans le domaine des fr\u00e9quences li\u00e9es \u00e0 la temp\u00e9rature, au vieillissement et aux microcircuits, r\u00e9duisant potentiellement le besoin de capteurs suppl\u00e9mentaires tout en simplifiant la conception de l’emballage.<\/p>\n

Disponibilit\u00e9<\/h2>\n

NXP pr\u00e9voit que le chipset compatible EIS sera disponible d\u00e9but 2026, avec un logiciel d’activation fonctionnant sur son microcontr\u00f4leur automobile S32K358. Ce lancement \u00e9largit le portefeuille d’\u00e9lectrification de l’entreprise, qui comprend d\u00e9j\u00e0 des contr\u00f4leurs de cellule, des passerelles et des contr\u00f4leurs de bo\u00eete de jonction de batterie pour les architectures de VE \u00e0 haute tension.<\/p>\n

\u00ab\u00a0La solution EIS apporte un puissant outil de diagnostic de qualit\u00e9 laboratoire dans le v\u00e9hicule. Elle simplifie la conception du syst\u00e8me en r\u00e9duisant le besoin de capteurs de temp\u00e9rature suppl\u00e9mentaires et soutient la transition vers une charge plus rapide, plus s\u00fbre et plus fiable sans compromettre la sant\u00e9 de la batterie. Le chipset offre \u00e9galement un chemin de mise \u00e0 niveau \u00e0 faible barri\u00e8re, avec des bo\u00eetiers compatibles broche \u00e0 broche qui peuvent \u00eatre directement mis \u00e0 niveau vers des modules sur cellule et des unit\u00e9s de contr\u00f4le de bo\u00eete de jonction de batterie \u00ab\u00a0, a d\u00e9clar\u00e9 Naomi Smit, VP et GM, Drivers and Energy System, NXP Semiconductors.<\/p>\n

Impact sur le diagnostic des v\u00e9hicules \u00e9lectriques<\/h2>\n

En int\u00e9grant la fonctionnalit\u00e9 EIS dans le silicium BMS de qualit\u00e9 industrielle, NXP vise \u00e0 rendre pratique l’\u00e9valuation de l’\u00e9tat des cellules bas\u00e9e sur l’imp\u00e9dance pour les v\u00e9hicules de s\u00e9rie. Si elle est valid\u00e9e dans le cadre de programmes europ\u00e9ens, cette approche pourrait offrir aux constructeurs automobiles une m\u00e9thode plus coh\u00e9rente pour pr\u00e9dire la d\u00e9gradation des batteries, faciliter l’analyse des garanties et am\u00e9liorer la surveillance de la s\u00e9curit\u00e9 pendant les cycles de charge rapide.<\/p>\n","protected":false},"excerpt":{"rendered":"

NXP Semiconductors a mis sur le march\u00e9 un jeu de puces de gestion de batterie qui int\u00e8gre la spectroscopie d’imp\u00e9dance \u00e9lectrochimique (EIS) directement dans son mat\u00e9riel. Cette technologie permet un diagnostic synchronis\u00e9 des cellules dans l’ensemble de la batterie, ce qui pourrait am\u00e9liorer la s\u00e9curit\u00e9, le contr\u00f4le de la charge et les performances \u00e0 long […]<\/p>\n","protected":false},"author":40,"featured_media":488042,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[883],"tags":[8166,4197,2741],"domains":[47],"ppma_author":[10387,6199],"class_list":["post-488108","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-technologies","tag-bms-fr","tag-nxp-fr","tag-ve","domains-electronique-eci"],"acf":[],"yoast_head":"NXP ajoute le SIE \u00e0 la gestion des batteries des VE ...<\/title>\n<meta name=\"description\" content=\"NXP int\u00e8gre le SIE dans son chipset de gestion de batterie pour VE, ce qui pourrait am\u00e9liorer la pr\u00e9cision du diagnostic et la 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