{"id":441184,"date":"2024-01-14T04:05:33","date_gmt":"2024-01-14T03:05:33","guid":{"rendered":"https:\/\/www.ecinews.fr\/?p=441184"},"modified":"2024-01-14T04:05:33","modified_gmt":"2024-01-14T03:05:33","slug":"cameras-thermiques-dediees-repondant-a-tous-les-besoins-en-matiere-de-tests-electroniques","status":"publish","type":"post","link":"https:\/\/www.ecinews.fr\/fr\/cameras-thermiques-dediees-repondant-a-tous-les-besoins-en-matiere-de-tests-electroniques\/","title":{"rendered":"Cam\u00e9ras thermiques d\u00e9di\u00e9es r\u00e9pondant \u00e0 tous les besoins en mati\u00e8re de tests \u00e9lectroniques"},"content":{"rendered":"<h3>Les ensembles de cam\u00e9ras thermiques hautes performances\u00a0<a href=\"https:\/\/www.flir.eu\/instruments\/science\/electronics\/complete-thermal-package-for-ednt\/?utm_source=&amp;utm_campaign=emea.emea.solutions.rd-sci.l.trade-release-edntpackage.me.app+electronicsdesignandtesting+ednt-package.other.bofu\">FLIR A6701<\/a> sont d\u00e9di\u00e9s aux applications \u00e9lectroniques.<\/h3>\n<p>Avec la transition actuelle vers des syst\u00e8mes d&rsquo;\u00e9nergie verte et des infrastructures connect\u00e9es, la demande de nouveaux syst\u00e8mes et composants \u00e9lectroniques cro\u00eet de mani\u00e8re exponentielle. Cette exigence requiert \u00e0 son tour des outils d\u2019appui aux prises de d\u00e9cisions cruciales tout au long de la cha\u00eene des t\u00e2ches de d\u00e9veloppement de produits : recherche et conception, assurance qualit\u00e9 et tests de v\u00e9rification, d\u00e9pannage et r\u00e9paration. L&rsquo;efficacit\u00e9 constitue un objectif prioritaire dans tous ces processus afin de contr\u00f4ler les co\u00fbts du projet et\/ou de r\u00e9duire les d\u00e9lais de mise sur le march\u00e9. Les ensembles de cam\u00e9ras thermiques hautes performances\u00a0<a href=\"https:\/\/www.flir.eu\/instruments\/science\/electronics\/complete-thermal-package-for-ednt\/?utm_source=&amp;utm_campaign=emea.emea.solutions.rd-sci.l.trade-release-edntpackage.me.app+electronicsdesignandtesting+ednt-package.other.bofu\">FLIR A6701<\/a> d\u00e9di\u00e9s aux applications \u00e9lectroniques sont \u00e0 m\u00eame d\u2019apporter une valeur ajout\u00e9e importante.<br \/>\nL&rsquo;imagerie thermique est essentielle \u00e0 l&rsquo;efficacit\u00e9 de la conception \u00e9lectronique et des tests de v\u00e9rification. Elle fournit des donn\u00e9es de temp\u00e9rature pr\u00e9cises pour r\u00e9soudre les probl\u00e8mes potentiels, optimiser les performances thermiques et m\u00eame identifier les composants contrefaits. La demande de solutions de plus en plus petites, denses et puissantes, constitue une tendance r\u00e9cente dans le secteur de l&rsquo;\u00e9lectronique. Toutefois, les conceptions qui tentent de s\u2019y conformer sont sujettes \u00e0 la chaleur intrins\u00e8que susceptible de causer des dommages importants. La thermographie infrarouge gagne par cons\u00e9quent en popularit\u00e9 au cours de la phase de d\u00e9veloppement, car elle permet d&rsquo;identifier les zones sensibles r\u00e9v\u00e9latrices de points de d\u00e9faillance ou de probl\u00e8mes avec l&rsquo;appareil.<br \/>\nLa cam\u00e9ra thermique infrarouge \u00e0 ondes moyennes\u00a0<a href=\"http:\/\/https\/www.flir.eu\/products\/a6700-mwir\/?vertical=rd%20science&amp;segment=solutionsutm_source=&amp;utm_campaign=emea.emea.solutions.rd-sci.l.trade-release-edntpackage.me.app+electronicsdesignandtesting+ednt-package.other.bofu\">A6700 MWIR<\/a>\u00a0qui fonctionne sur la plage 3,0-5,0 \u00b5m (option large bande 1,0-5,0 \u00b5m) et produit des images finement d\u00e9taill\u00e9es de 327 680 (640 x 512) pixels, est au c\u0153ur des ensembles \u00e9conomiques de FLIR destin\u00e9s aux tests \u00e9lectroniques. Avantage suppl\u00e9mentaire : avec les interfaces Gigabit Ethernet et vid\u00e9o analogique actives simultan\u00e9ment, l&rsquo;A6700 offre un contr\u00f4le ind\u00e9pendant de chacune pour une flexibilit\u00e9 accrue lors de l&rsquo;enregistrement.<br \/>\nAfin de fournir une solution optimale pour les tests \u00e9lectroniques, FLIR peut associer l&rsquo;A6700 soit \u00e0 un objectif macro et un support, soit \u00e0 un objectif de microscope et un support. Les deux ensembles portent la d\u00e9signation A6701.<br \/>\nLa FLIR A6701 avec macro-objectif MWIR et support constitue un syst\u00e8me flexible pour une large gamme de tests d&rsquo;assemblages \u00e9lectroniques et de sous-composants, tout en fournissant les petites r\u00e9solutions spatiales requises pour la mesure pr\u00e9cise de la temp\u00e9rature des composants individuels mont\u00e9s en surface. Outre une mise au point \u00e0 l&rsquo;infini, l&rsquo;objectif peut fournir, \u00e0 sa distance de travail minimale de 110 mm, un champ de vision total de 21,2 \u00d7 16,9 mm avec une r\u00e9solution spatiale de 33 \u00b5m par pixel.<br \/>\nPar ailleurs, l&rsquo;ensemble FLIR A6701 MIWR comprenant un objectif de microscope et un support contribue \u00e0 am\u00e9liorer l&rsquo;efficacit\u00e9 \u00e9lectrique en identifiant les petites anomalies thermiques dans les circuits int\u00e9gr\u00e9s ou en mesurant la chaleur d\u00e9gag\u00e9e par les composants individuels. Le statif de microscope stabilise l&rsquo;ensemble du syst\u00e8me pour obtenir des images claires couvrant une zone cible de 9,6 x 7,68 mm avec une r\u00e9solution spatiale de 15 \u00b5m par pixel.<br \/>\nLes utilisateurs des ensembles pratiques et \u00e9conomiques FLIR A6701 peuvent optimiser leur analyse et le partage des donn\u00e9es avec Research Studio Professional Edition de FLIR. Ce logiciel d&rsquo;analyse thermique avanc\u00e9 dispense un flux de travail simplifi\u00e9 pour l&rsquo;affichage, l&rsquo;enregistrement et l&rsquo;\u00e9valuation de donn\u00e9es de temp\u00e9rature pr\u00e9cises.<br \/>\nLes cam\u00e9ras thermiques infrarouges FLIR deviennent rapidement un outil standard sur chaque banc d&rsquo;essai \u00e9lectronique. En associant une cam\u00e9ra, un objectif et un support, les ensembles comme la FLIR A6701 offrent une solution pr\u00eate \u00e0 l&#8217;emploi pour les tests \u00e9lectroniques, renforc\u00e9e par l&rsquo;ajout du logiciel d&rsquo;analyse et de partage de donn\u00e9es FLIR Research Studio. Il est temps de faire passer les tests \u00e9lectroniques au niveau sup\u00e9rieur.<\/p>\n<p>\u00a0<br \/>\n<a title=\"www.teledyneflir.com\" href=\"http:\/\/www.teledyneflir.com\">www.teledyneflir.com<\/a><\/p>\n<p><a href=\"https:\/\/news.google.com\/publications\/CAAqBwgKMJbcwQswuPfYAw?hl=fr&amp;gl=BE&amp;ceid=BE:fr\">Suivre ECInews sur Google news<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Les ensembles de cam\u00e9ras thermiques hautes performances\u00a0FLIR A6701 sont d\u00e9di\u00e9s aux applications \u00e9lectroniques. Avec la transition actuelle vers des syst\u00e8mes d&rsquo;\u00e9nergie verte et des infrastructures connect\u00e9es, la demande de nouveaux syst\u00e8mes et composants \u00e9lectroniques cro\u00eet de mani\u00e8re exponentielle. Cette exigence requiert \u00e0 son tour des outils d\u2019appui aux prises de d\u00e9cisions cruciales tout au long [&hellip;]<\/p>\n","protected":false},"author":36,"featured_media":441185,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[881],"tags":[1321],"domains":[47],"ppma_author":[1154],"class_list":["post-441184","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-nouveaux-produits","tag-cameras","domains-electronique-eci"],"acf":[],"yoast_head":"<title>Cam\u00e9ras thermiques d\u00e9di\u00e9es r\u00e9pondant \u00e0 tous les besoins en...<\/title>\n<meta name=\"description\" content=\"Les ensembles de cam\u00e9ras thermiques hautes performances\u00a0FLIR A6701 sont d\u00e9di\u00e9s aux applications \u00e9lectroniques.\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, 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