{"id":234372,"date":"2015-10-01T22:00:00","date_gmt":"2015-10-01T22:00:00","guid":{"rendered":"https:\/\/eenewseurope.artwhere.co\/ensemble-de-test-pour-levaluation-de-modules-optiques-multi-canaux\/"},"modified":"2015-10-01T22:00:00","modified_gmt":"2015-10-01T22:00:00","slug":"ensemble-de-test-pour-levaluation-de-modules-optiques-multi-canaux","status":"publish","type":"post","link":"https:\/\/www.ecinews.fr\/fr\/ensemble-de-test-pour-levaluation-de-modules-optiques-multi-canaux\/","title":{"rendered":"Ensemble de test pour l\u2019\u00e9valuation de modules optiques multi-canaux"},"content":{"rendered":"<p>Les centres de donn&eacute;es doivent accro&icirc;tre rapidement la capacit&eacute; de transmission de leurs serveurs et de leurs &eacute;quipements de r&eacute;seaux pour r&eacute;pondre &agrave; la demande explosive des services du Cloud. De ce fait, la demande en R&amp;D sur les technologies de transmission et en &eacute;quipements haut-d&eacute;bits est en augmentation, d&rsquo;o&ugrave; la n&eacute;cessit&eacute; de r&eacute;aliser des tests pour s&rsquo;assurer l&rsquo;int&eacute;grit&eacute; des signaux dans ces technologies et &eacute;quipements.<br \/>\nPour r&eacute;pondre &agrave; ces besoins, cet analyseur tout-en-un supporte simultan&eacute;ment les mesures de taux d&rsquo;erreur binaire (BER) et les diagrammes de l&rsquo;&oelig;il. A la diff&eacute;rence des syst&egrave;mes conventionnels couvrant ces mesures qui n&eacute;cessitent deux instruments distincts, un seul appareil de ce type peut supporter l&rsquo;ensemble des tests n&eacute;cessaires, diminuant ainsi de pr&egrave;s de 40% le co&ucirc;t d&rsquo;&eacute;quipement. D&rsquo;autre part, l&rsquo;ajout d&rsquo;un commutateur et d&rsquo;un att&eacute;nuateur optique, en tant qu&rsquo;accessoires optionnels, fait de cette derni&egrave;re version une solution de mesure compl&egrave;te pour l&rsquo;&eacute;valuation de composants et modules multi-canaux optiques.<br \/>\nPour supporter les plus hauts d&eacute;bits de mesure exig&eacute;es par les fabricants, un mode d&rsquo;&eacute;chantillonnage rapide allant jusqu&rsquo;&agrave; 150 k&eacute;ch.\/s ex&eacute;cute les analyses de diagramme de l&rsquo;&oelig;il. Les tests pour les masques de l&rsquo;&oelig;il sont 1,5 fois plus rapides que les mod&egrave;les conventionnels. De plus, la mesure du taux d&rsquo;erreurs binaires int&eacute;gr&eacute;e peut &eacute;voluer sur 4 canaux pour des mesures BER simultan&eacute;es de modules optiques multi-canaux tels que QSFP+, diminuant jusqu&rsquo;&agrave; 80% le temps de test par rapport aux mod&egrave;les traditionnels. <\/p>\n<\/p>\n<p><a title=\"www.anritsu.com\/mp2100b\" target=\"_blank\" href=\"http:\/\/www.anritsu.com\/en-gb\/products-solutions\/products\/mp2100b.aspx\" rel=\"noopener\">www.anritsu.com\/mp2100b<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Int\u00e9grant les mesures de taux d&rsquo;erreur binaire (BERT) et un oscilloscope \u00e0 \u00e9chantillonnage, l\u2019analyseur tout-en-un MP2100B BERTWave d\u2019Anritsu permet de d\u00e9velopper et fabriquer des modules et composants \u00e9lectriques et optiques. Il succ\u00e8de au MP2100A en apportant plus d\u2019efficacit\u00e9 pour l\u2019\u00e9valuation de modules optiques multi-canaux.<\/p>\n","protected":false},"author":22,"featured_media":234373,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[881],"tags":[],"domains":[47],"ppma_author":[1149],"class_list":["post-234372","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-nouveaux-produits","domains-electronique-eci"],"acf":[],"yoast_head":"<title>Ensemble de test pour l\u2019\u00e9valuation de modules optiques multi...<\/title>\n<meta name=\"description\" content=\"Int\u00e9grant les mesures de taux d&#039;erreur binaire (BERT) et un oscilloscope \u00e0 \u00e9chantillonnage, l\u2019analyseur tout-en-un MP2100B BERTWave d\u2019Anritsu permet...\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts\/234372\/\" \/>\n<meta property=\"og:locale\" content=\"fr_FR\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Ensemble de test pour l\u2019\u00e9valuation de modules optiques multi-canaux\" \/>\n<meta property=\"og:description\" content=\"Int\u00e9grant les mesures de taux d&#039;erreur binaire (BERT) et un oscilloscope \u00e0 \u00e9chantillonnage, l\u2019analyseur tout-en-un MP2100B BERTWave d\u2019Anritsu permet de d\u00e9velopper et fabriquer des modules et composants \u00e9lectriques et optiques. Il succ\u00e8de au MP2100A en apportant plus d\u2019efficacit\u00e9 pour l\u2019\u00e9valuation de modules optiques multi-canaux.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts\/234372\/\" \/>\n<meta property=\"og:site_name\" content=\"EENewsEurope\" \/>\n<meta property=\"article:published_time\" content=\"2015-10-01T22:00:00+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/www.ecinews.fr\/wp-content\/uploads\/import\/default\/files\/import\/eci7419_anritsu_anr023-mp2100b-fronttophi_r.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"1574\" \/>\n\t<meta property=\"og:image:height\" content=\"1192\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"author\" content=\"eeNews Europe\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"eeNews Europe\" \/>\n\t<meta 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