{"id":231372,"date":"2014-10-30T23:00:00","date_gmt":"2014-10-30T23:00:00","guid":{"rendered":"https:\/\/eenewseurope.artwhere.co\/seica-presentera-ses-solutions-de-test-a-electronica-2014\/"},"modified":"2014-10-30T23:00:00","modified_gmt":"2014-10-30T23:00:00","slug":"seica-presentera-ses-solutions-de-test-a-electronica-2014","status":"publish","type":"post","link":"https:\/\/www.ecinews.fr\/fr\/seica-presentera-ses-solutions-de-test-a-electronica-2014\/","title":{"rendered":"Seica pr\u00e9sentera ses solutions de test \u00e0 electronica 2014"},"content":{"rendered":"<p>Le testeur fonctionnel combin&eacute; in-situ QUAD-JOB Compact SL r&eacute;alisera un test de panneau de carte &agrave; haute vitesse pour les environnements de production &agrave; fort volume qui mat&eacute;rialisera ses normes de qualit&eacute; de haut niveau tant en termes de mesures que tra&ccedil;abilit&eacute; des donn&eacute;es, sa configuration en ligne enti&egrave;rement automatis&eacute;e et de r&eacute;els tests en parall&egrave;le des 4 UUTs en simultan&eacute;. De plus, l&rsquo;architecture du syst&egrave;me conforme au WCM t&eacute;moigne de la fa&ccedil;on dont les concepts de lean-production ont &eacute;t&eacute; mis en &oelig;uvre sur la ligne Compact pour obtenir un encombrement r&eacute;duit, sans affecter les performances.<br \/>\nExpos&eacute; avec son support de chargement \/ d&eacute;chargement, le Pilot4DV8 montrera un exemple de tests multifonctions, avec ses huit sondes mobiles permettant de communiquer avec les deux c&ocirc;t&eacute;s de l&rsquo;UUT et ceci sans l&rsquo;aide d&rsquo;un op&eacute;rateur. Il prouvera &eacute;galement sa capacit&eacute; &agrave; effectuer des tests de mise sous tension, des tests boundary scan, des programmations embarqu&eacute;es, des contr&ocirc;les visuels 2D et 3D, des tests optiques de composants opto&eacute;lectroniques, la possibilit&eacute; de tester tr&egrave;s petits composants, garantissant une pr&eacute;cision et une r&eacute;p&eacute;tabilit&eacute; tangible et in&eacute;gal&eacute;e.<br \/>\nCha&icirc;non manquant devenu r&eacute;alit&eacute;, la plate-forme PILOT FX qui combine tests fonctionnels et in-circuit, repr&eacute;sente le juste &eacute;quilibre entre le d&eacute;bit d&rsquo;essai et la flexibilit&eacute; de test. Gr&acirc;ce &agrave; son syst&egrave;me m&eacute;canique r&eacute;volutionnaire du mouvement, elle est en mesure d&rsquo;appliquer des programmes de test d&eacute;di&eacute;s et combinatoires de panneaux de cartes, d&rsquo;optimiser le partage et la multiplication des ressources co&ucirc;teuses.<\/p>\n<\/p>\n<p><a title=\"www.seica.com\/en\" href=\"http:\/\/www.seica.com\/Sito\/en\/Home.aspx\">www.seica.com\/en<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Innovation, automatisation et optimisation sont les trois mots-cl\u00e9s qui caract\u00e9risent les solutions de test pour cartes \u00e9lectroniques pr\u00e9sent\u00e9es cette ann\u00e9e par Seica sur son stand au salon electronica. Trois syst\u00e8mes enti\u00e8rement automatis\u00e9s fourniront une vue d&rsquo;ensemble du savoir-faire de l\u2019entreprise dans tous les proc\u00e9d\u00e9s de test y compris celui optique des diodes \u00e9lectroluminescentes.<\/p>\n","protected":false},"author":22,"featured_media":231373,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[],"tags":[],"domains":[47],"ppma_author":[1149],"class_list":["post-231372","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","domains-electronique-eci"],"acf":[],"yoast_head":"<title>Seica pr\u00e9sentera ses solutions de test \u00e0 electronica 2014 ...<\/title>\n<meta name=\"description\" content=\"Innovation, automatisation et optimisation sont les trois mots-cl\u00e9s qui caract\u00e9risent les solutions de test pour cartes \u00e9lectroniques pr\u00e9sent\u00e9es cette...\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts\/231372\/\" \/>\n<meta property=\"og:locale\" content=\"fr_FR\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Seica pr\u00e9sentera ses solutions de test \u00e0 electronica 2014\" \/>\n<meta property=\"og:description\" content=\"Innovation, automatisation et optimisation sont les trois mots-cl\u00e9s qui caract\u00e9risent les solutions de test pour cartes \u00e9lectroniques pr\u00e9sent\u00e9es cette ann\u00e9e par Seica sur son stand au salon electronica. Trois syst\u00e8mes enti\u00e8rement automatis\u00e9s fourniront une vue d&#039;ensemble du savoir-faire de l\u2019entreprise dans tous les proc\u00e9d\u00e9s de test y compris celui optique des diodes \u00e9lectroluminescentes.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts\/231372\/\" \/>\n<meta property=\"og:site_name\" content=\"EENewsEurope\" \/>\n<meta property=\"article:published_time\" content=\"2014-10-30T23:00:00+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/www.ecinews.fr\/wp-content\/uploads\/import\/default\/files\/import\/eci7005_seika_compact-sl_r-scaled.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"2560\" \/>\n\t<meta property=\"og:image:height\" content=\"2181\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"author\" content=\"eeNews Europe\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written 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