{"id":228162,"date":"2013-10-07T22:00:00","date_gmt":"2013-10-07T22:00:00","guid":{"rendered":"https:\/\/eenewseurope.artwhere.co\/rapport-detude-ni-2013-sur-le-test-automatique\/"},"modified":"2013-10-07T22:00:00","modified_gmt":"2013-10-07T22:00:00","slug":"rapport-detude-ni-2013-sur-le-test-automatique","status":"publish","type":"post","link":"https:\/\/www.ecinews.fr\/fr\/rapport-detude-ni-2013-sur-le-test-automatique\/","title":{"rendered":"Rapport d&rsquo;\u00e9tude NI 2013 sur le test automatique"},"content":{"rendered":"<p>Les t<strong>endances d&eacute;velopp&eacute;es dans le rapport<\/strong><strong> <\/strong>couvrent tout le spectre du test&nbsp;:<\/p>\n<p>&#8211; Strat&eacute;gie d&rsquo;entreprise : l&rsquo;aspect &eacute;conomique du test <br \/>\n&#8211; Architecture : des &eacute;cosyst&egrave;mes centr&eacute;s sur le logiciel <br \/>\n&#8211; Traitement : de gros volumes de donn&eacute;es analogiques <br \/>\n&#8211; Logiciels : qualifier les logiciels de test <br \/>\n&#8211; Entr&eacute;es\/Sorties : quand la loi de Moore rencontre la RF<\/p>\n<p>&nbsp;<\/p>\n<p><a title=\"www.ni.com\" target=\"_blank\" href=\"http:\/\/www.ni.com\/ato\/f\/?metc=mtu8zg&amp;espuid=CNATL000004584525\" rel=\"noopener\">www.ni.com<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>National Instruments a publi\u00e9 son rapport d&rsquo;\u00e9tude 2013 sur le test automatique, en version fran\u00e7aise. Synth\u00e8se de recherches, de d\u00e9bats et des retours d&rsquo;informations des clients de National Instruments, ce document fait le point sur les tendances technologiques et m\u00e9thodologiques dans l&rsquo;industrie du test.<\/p>\n","protected":false},"author":22,"featured_media":228163,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[],"tags":[],"domains":[47],"ppma_author":[1149],"class_list":["post-228162","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","domains-electronique-eci"],"acf":[],"yoast_head":"<title>Rapport d&#039;\u00e9tude NI 2013 sur le test automatique ...<\/title>\n<meta name=\"description\" content=\"National Instruments a publi\u00e9 son rapport d&#039;\u00e9tude 2013 sur le test automatique, en version fran\u00e7aise. 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Synth\u00e8se de recherches, de d\u00e9bats et des retours d&#039;informations des clients de National Instruments, ce document fait le point sur les tendances technologiques et m\u00e9thodologiques dans l&#039;industrie du test.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts\/228162\/\" \/>\n<meta property=\"og:site_name\" content=\"EENewsEurope\" \/>\n<meta property=\"article:published_time\" content=\"2013-10-07T22:00:00+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/www.ecinews.fr\/wp-content\/uploads\/import\/default\/files\/import\/eci3891_ni.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"215\" \/>\n\t<meta property=\"og:image:height\" content=\"161\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"author\" content=\"eeNews Europe\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"eeNews Europe\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\/\/www.ecinews.fr\/fr\/rapport-detude-ni-2013-sur-le-test-automatique\/#article\",\"isPartOf\":{\"@id\":\"https:\/\/www.ecinews.fr\/fr\/rapport-detude-ni-2013-sur-le-test-automatique\/\"},\"author\":{\"name\":\"eeNews Europe\",\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#\/schema\/person\/9eff4051fa9dac8230052de45e32b0f4\"},\"headline\":\"Rapport d&rsquo;\u00e9tude NI 2013 sur le test automatique\",\"datePublished\":\"2013-10-07T22:00:00+00:00\",\"dateModified\":\"2013-10-07T22:00:00+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\/\/www.ecinews.fr\/fr\/rapport-detude-ni-2013-sur-le-test-automatique\/\"},\"wordCount\":84,\"publisher\":{\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#organization\"},\"inLanguage\":\"fr-FR\"},{\"@type\":\"WebPage\",\"@id\":\"https:\/\/www.ecinews.fr\/fr\/rapport-detude-ni-2013-sur-le-test-automatique\/\",\"url\":\"https:\/\/www.ecinews.fr\/fr\/rapport-detude-ni-2013-sur-le-test-automatique\/\",\"name\":\"Rapport d'\u00e9tude NI 2013 sur le test automatique -\",\"isPartOf\":{\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#website\"},\"datePublished\":\"2013-10-07T22:00:00+00:00\",\"dateModified\":\"2013-10-07T22:00:00+00:00\",\"breadcrumb\":{\"@id\":\"https:\/\/www.ecinews.fr\/fr\/rapport-detude-ni-2013-sur-le-test-automatique\/#breadcrumb\"},\"inLanguage\":\"fr-FR\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\/\/www.ecinews.fr\/fr\/rapport-detude-ni-2013-sur-le-test-automatique\/\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\/\/www.ecinews.fr\/fr\/rapport-detude-ni-2013-sur-le-test-automatique\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\/\/www.ecinews.fr\/fr\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Rapport d&rsquo;\u00e9tude NI 2013 sur le test automatique\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#website\",\"url\":\"https:\/\/www.eenewseurope.com\/en\/\",\"name\":\"EENewsEurope\",\"description\":\"Just another WordPress site\",\"publisher\":{\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\/\/www.eenewseurope.com\/en\/?s={search_term_string}\"},\"query-input\":\"required name=search_term_string\"}],\"inLanguage\":\"fr-FR\"},{\"@type\":\"Organization\",\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#organization\",\"name\":\"EENewsEurope\",\"url\":\"https:\/\/www.eenewseurope.com\/en\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"fr-FR\",\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#\/schema\/logo\/image\/\",\"url\":\"https:\/\/www.ecinews.fr\/wp-content\/uploads\/2022\/02\/logo-1.jpg\",\"contentUrl\":\"https:\/\/www.ecinews.fr\/wp-content\/uploads\/2022\/02\/logo-1.jpg\",\"width\":283,\"height\":113,\"caption\":\"EENewsEurope\"},\"image\":{\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#\/schema\/logo\/image\/\"}},{\"@type\":\"Person\",\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#\/schema\/person\/9eff4051fa9dac8230052de45e32b0f4\",\"name\":\"eeNews Europe\",\"image\":{\"@type\":\"ImageObject\",\"inLanguage\":\"fr-FR\",\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#\/schema\/person\/image\/fae8f0cb15861c4ae0ed4872e2c9fc22\",\"url\":\"https:\/\/secure.gravatar.com\/avatar\/5081509054e28b04ecd976976e723ce0?s=96&d=mm&r=g\",\"contentUrl\":\"https:\/\/secure.gravatar.com\/avatar\/5081509054e28b04ecd976976e723ce0?s=96&d=mm&r=g\",\"caption\":\"eeNews Europe\"}}]}<\/script>","yoast_head_json":{"title":"Rapport d'\u00e9tude NI 2013 sur le test automatique ...","description":"National Instruments a publi\u00e9 son rapport d'\u00e9tude 2013 sur le test automatique, en version fran\u00e7aise. 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