{"id":227610,"date":"2013-07-22T22:00:00","date_gmt":"2013-07-22T22:00:00","guid":{"rendered":"https:\/\/eenewseurope.artwhere.co\/nouvelle-methode-de-test-pour-condensateurs-au-tantale\/"},"modified":"2013-07-22T22:00:00","modified_gmt":"2013-07-22T22:00:00","slug":"nouvelle-methode-de-test-pour-condensateurs-au-tantale","status":"publish","type":"post","link":"https:\/\/www.ecinews.fr\/fr\/nouvelle-methode-de-test-pour-condensateurs-au-tantale\/","title":{"rendered":"Nouvelle m\u00e9thode de test pour condensateurs au tantale"},"content":{"rendered":"<p>Pilot&eacute;e par les organismes de standardisation MIL et utilis&eacute;e depuis des d&eacute;cennies pour caract&eacute;riser la fiabilit&eacute; des condensateurs au tantale, la m&eacute;thode Weibull a perdu de sa pertinence en raison des progr&egrave;s consid&eacute;rables des technologies de fabrication et de test. &nbsp;Hautement efficace, la nouvelle m&eacute;thode Q-Process d&rsquo;AVX fait l&rsquo;objet d&rsquo;un brevet provisoire et est mise en place pour les condensateurs tantale de qualit&eacute; m&eacute;dicale en petits bo&icirc;tiers. Sa disponibilit&eacute; pour les produits militaires et a&eacute;rospatiaux est pr&eacute;vue pour le courant de l&rsquo;ann&eacute;e. Pour en savoir plus sur Q-process et la m&eacute;thode des lots, veuillez consulter l&rsquo;article &quot;&nbsp;Reaching the Highest Reliability for Tantalum Capacitors&nbsp;&quot; pr&eacute;sent&eacute; par AVX &agrave; la conf&eacute;rence CARTS et mis en ligne &agrave; l&rsquo;adresse <a href=\"http:\/\/avx.com\/docs\/techinfo\/Qprocess.pdf\"><br \/>\n<\/a><\/p>\n<p><a href=\"http:\/\/avx.com\/docs\/techinfo\/Qprocess.pdf\" target=\"_blank\" title=\"avx.com\/docs\/techinfo\/Qprocess.pdf\" rel=\"noopener\">avx.com\/docs\/techinfo\/Qprocess.pdf<\/a><\/p>\n<p><a href=\"http:\/\/www.avx.com\" target=\"_blank\" title=\"www.avx.com\" rel=\"noopener\">www.avx.com<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>AVX Corporation a d\u00e9velopp\u00e9 une m\u00e9thode de qualification novatrice efficace pour la fabrication et test de condensateurs tantale haute fiabilit\u00e9. Initialement pr\u00e9sent\u00e9e \u00e0 des acteurs influents des industries militaires et a\u00e9rospatiales au Tantalum Hi-Rel Symposium \u00e0 Biddeford, Maine, en janvier dernier, la m\u00e9thode Q-Process a aussi \u00e9t\u00e9 d\u00e9crite dans une communication \u00e0 la conf\u00e9rence internationale CARTS (Capacitor and Resistor Technical Symposium) \u00e0 Houston, Texas, le 26 mars dernier. Bien re\u00e7ue par les participants aux deux \u00e9v\u00e9nements, elle est pr\u00eate \u00e0 remplacer la qualification Weibull comme standard industriel d&rsquo;\u00e9valuation de la fiabilit\u00e9 des condensateurs au tantale.<\/p>\n","protected":false},"author":22,"featured_media":227611,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[],"tags":[],"domains":[47],"ppma_author":[1149],"class_list":["post-227610","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","domains-electronique-eci"],"acf":[],"yoast_head":"<title>Nouvelle m\u00e9thode de test pour condensateurs au tantale ...<\/title>\n<meta name=\"description\" content=\"AVX Corporation a d\u00e9velopp\u00e9 une m\u00e9thode de qualification novatrice efficace pour la fabrication et test de condensateurs tantale haute fiabilit\u00e9....\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts\/227610\/\" \/>\n<meta property=\"og:locale\" content=\"fr_FR\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Nouvelle m\u00e9thode de test pour condensateurs au tantale\" \/>\n<meta property=\"og:description\" content=\"AVX Corporation a d\u00e9velopp\u00e9 une m\u00e9thode de qualification novatrice efficace pour la fabrication et test de condensateurs tantale haute fiabilit\u00e9. Initialement pr\u00e9sent\u00e9e \u00e0 des acteurs influents des industries militaires et a\u00e9rospatiales au Tantalum Hi-Rel Symposium \u00e0 Biddeford, Maine, en janvier dernier, la m\u00e9thode Q-Process a aussi \u00e9t\u00e9 d\u00e9crite dans une communication \u00e0 la conf\u00e9rence internationale CARTS (Capacitor and Resistor Technical Symposium) \u00e0 Houston, Texas, le 26 mars dernier. Bien re\u00e7ue par les participants aux deux \u00e9v\u00e9nements, elle est pr\u00eate \u00e0 remplacer la qualification Weibull comme standard industriel d&#039;\u00e9valuation de la fiabilit\u00e9 des condensateurs au tantale.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts\/227610\/\" \/>\n<meta property=\"og:site_name\" content=\"EENewsEurope\" \/>\n<meta property=\"article:published_time\" content=\"2013-07-22T22:00:00+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/www.ecinews.fr\/wp-content\/uploads\/import\/default\/files\/import\/eci3833_avx_avv716-q-process-scaled.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"2560\" \/>\n\t<meta property=\"og:image:height\" content=\"2126\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"author\" content=\"eeNews Europe\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written 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tantale\",\"datePublished\":\"2013-07-22T22:00:00+00:00\",\"dateModified\":\"2013-07-22T22:00:00+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\/\/www.ecinews.fr\/fr\/nouvelle-methode-de-test-pour-condensateurs-au-tantale\/\"},\"wordCount\":181,\"publisher\":{\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#organization\"},\"inLanguage\":\"fr-FR\"},{\"@type\":\"WebPage\",\"@id\":\"https:\/\/www.ecinews.fr\/fr\/nouvelle-methode-de-test-pour-condensateurs-au-tantale\/\",\"url\":\"https:\/\/www.ecinews.fr\/fr\/nouvelle-methode-de-test-pour-condensateurs-au-tantale\/\",\"name\":\"Nouvelle m\u00e9thode de test pour condensateurs au tantale -\",\"isPartOf\":{\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#website\"},\"datePublished\":\"2013-07-22T22:00:00+00:00\",\"dateModified\":\"2013-07-22T22:00:00+00:00\",\"breadcrumb\":{\"@id\":\"https:\/\/www.ecinews.fr\/fr\/nouvelle-methode-de-test-pour-condensateurs-au-tantale\/#breadcrumb\"},\"inLanguage\":\"fr-FR\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\/\/www.ecinews.fr\/fr\/nouvelle-methode-de-test-pour-condensateurs-au-tantale\/\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\/\/www.ecinews.fr\/fr\/nouvelle-methode-de-test-pour-condensateurs-au-tantale\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\/\/www.ecinews.fr\/fr\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Nouvelle m\u00e9thode de test pour condensateurs au tantale\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#website\",\"url\":\"https:\/\/www.eenewseurope.com\/en\/\",\"name\":\"EENewsEurope\",\"description\":\"Just another WordPress site\",\"publisher\":{\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\/\/www.eenewseurope.com\/en\/?s={search_term_string}\"},\"query-input\":\"required name=search_term_string\"}],\"inLanguage\":\"fr-FR\"},{\"@type\":\"Organization\",\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#organization\",\"name\":\"EENewsEurope\",\"url\":\"https:\/\/www.eenewseurope.com\/en\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"fr-FR\",\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#\/schema\/logo\/image\/\",\"url\":\"https:\/\/www.ecinews.fr\/wp-content\/uploads\/2022\/02\/logo-1.jpg\",\"contentUrl\":\"https:\/\/www.ecinews.fr\/wp-content\/uploads\/2022\/02\/logo-1.jpg\",\"width\":283,\"height\":113,\"caption\":\"EENewsEurope\"},\"image\":{\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#\/schema\/logo\/image\/\"}},{\"@type\":\"Person\",\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#\/schema\/person\/9eff4051fa9dac8230052de45e32b0f4\",\"name\":\"eeNews Europe\",\"image\":{\"@type\":\"ImageObject\",\"inLanguage\":\"fr-FR\",\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#\/schema\/person\/image\/fae8f0cb15861c4ae0ed4872e2c9fc22\",\"url\":\"https:\/\/secure.gravatar.com\/avatar\/5081509054e28b04ecd976976e723ce0?s=96&d=mm&r=g\",\"contentUrl\":\"https:\/\/secure.gravatar.com\/avatar\/5081509054e28b04ecd976976e723ce0?s=96&d=mm&r=g\",\"caption\":\"eeNews Europe\"}}]}<\/script>","yoast_head_json":{"title":"Nouvelle m\u00e9thode de test pour condensateurs au tantale ...","description":"AVX Corporation a d\u00e9velopp\u00e9 une m\u00e9thode de qualification novatrice efficace pour la fabrication et test de condensateurs tantale haute fiabilit\u00e9....","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts\/227610\/","og_locale":"fr_FR","og_type":"article","og_title":"Nouvelle m\u00e9thode de test pour condensateurs au tantale","og_description":"AVX Corporation a d\u00e9velopp\u00e9 une m\u00e9thode de qualification novatrice efficace pour la fabrication et test de condensateurs tantale haute fiabilit\u00e9. Initialement pr\u00e9sent\u00e9e \u00e0 des acteurs influents des industries militaires et a\u00e9rospatiales au Tantalum Hi-Rel Symposium \u00e0 Biddeford, Maine, en janvier dernier, la m\u00e9thode Q-Process a aussi \u00e9t\u00e9 d\u00e9crite dans une communication \u00e0 la conf\u00e9rence internationale CARTS (Capacitor and Resistor Technical Symposium) \u00e0 Houston, Texas, le 26 mars dernier. Bien re\u00e7ue par les participants aux deux \u00e9v\u00e9nements, elle est pr\u00eate \u00e0 remplacer la qualification Weibull comme standard industriel d'\u00e9valuation de la fiabilit\u00e9 des condensateurs au tantale.","og_url":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts\/227610\/","og_site_name":"EENewsEurope","article_published_time":"2013-07-22T22:00:00+00:00","og_image":[{"width":2560,"height":2126,"url":"https:\/\/www.ecinews.fr\/wp-content\/uploads\/import\/default\/files\/import\/eci3833_avx_avv716-q-process-scaled.jpg","type":"image\/jpeg"}],"author":"eeNews Europe","twitter_card":"summary_large_image","twitter_misc":{"Written by":"eeNews Europe","Est. reading time":"1 minute"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/www.ecinews.fr\/fr\/nouvelle-methode-de-test-pour-condensateurs-au-tantale\/#article","isPartOf":{"@id":"https:\/\/www.ecinews.fr\/fr\/nouvelle-methode-de-test-pour-condensateurs-au-tantale\/"},"author":{"name":"eeNews Europe","@id":"https:\/\/www.eenewseurope.com\/en\/#\/schema\/person\/9eff4051fa9dac8230052de45e32b0f4"},"headline":"Nouvelle m\u00e9thode de test pour condensateurs au tantale","datePublished":"2013-07-22T22:00:00+00:00","dateModified":"2013-07-22T22:00:00+00:00","mainEntityOfPage":{"@id":"https:\/\/www.ecinews.fr\/fr\/nouvelle-methode-de-test-pour-condensateurs-au-tantale\/"},"wordCount":181,"publisher":{"@id":"https:\/\/www.eenewseurope.com\/en\/#organization"},"inLanguage":"fr-FR"},{"@type":"WebPage","@id":"https:\/\/www.ecinews.fr\/fr\/nouvelle-methode-de-test-pour-condensateurs-au-tantale\/","url":"https:\/\/www.ecinews.fr\/fr\/nouvelle-methode-de-test-pour-condensateurs-au-tantale\/","name":"Nouvelle m\u00e9thode de test pour condensateurs au tantale -","isPartOf":{"@id":"https:\/\/www.eenewseurope.com\/en\/#website"},"datePublished":"2013-07-22T22:00:00+00:00","dateModified":"2013-07-22T22:00:00+00:00","breadcrumb":{"@id":"https:\/\/www.ecinews.fr\/fr\/nouvelle-methode-de-test-pour-condensateurs-au-tantale\/#breadcrumb"},"inLanguage":"fr-FR","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.ecinews.fr\/fr\/nouvelle-methode-de-test-pour-condensateurs-au-tantale\/"]}]},{"@type":"BreadcrumbList","@id":"https:\/\/www.ecinews.fr\/fr\/nouvelle-methode-de-test-pour-condensateurs-au-tantale\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/www.ecinews.fr\/fr\/"},{"@type":"ListItem","position":2,"name":"Nouvelle m\u00e9thode de test pour condensateurs au tantale"}]},{"@type":"WebSite","@id":"https:\/\/www.eenewseurope.com\/en\/#website","url":"https:\/\/www.eenewseurope.com\/en\/","name":"EENewsEurope","description":"Just another WordPress site","publisher":{"@id":"https:\/\/www.eenewseurope.com\/en\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.eenewseurope.com\/en\/?s={search_term_string}"},"query-input":"required name=search_term_string"}],"inLanguage":"fr-FR"},{"@type":"Organization","@id":"https:\/\/www.eenewseurope.com\/en\/#organization","name":"EENewsEurope","url":"https:\/\/www.eenewseurope.com\/en\/","logo":{"@type":"ImageObject","inLanguage":"fr-FR","@id":"https:\/\/www.eenewseurope.com\/en\/#\/schema\/logo\/image\/","url":"https:\/\/www.ecinews.fr\/wp-content\/uploads\/2022\/02\/logo-1.jpg","contentUrl":"https:\/\/www.ecinews.fr\/wp-content\/uploads\/2022\/02\/logo-1.jpg","width":283,"height":113,"caption":"EENewsEurope"},"image":{"@id":"https:\/\/www.eenewseurope.com\/en\/#\/schema\/logo\/image\/"}},{"@type":"Person","@id":"https:\/\/www.eenewseurope.com\/en\/#\/schema\/person\/9eff4051fa9dac8230052de45e32b0f4","name":"eeNews Europe","image":{"@type":"ImageObject","inLanguage":"fr-FR","@id":"https:\/\/www.eenewseurope.com\/en\/#\/schema\/person\/image\/fae8f0cb15861c4ae0ed4872e2c9fc22","url":"https:\/\/secure.gravatar.com\/avatar\/5081509054e28b04ecd976976e723ce0?s=96&d=mm&r=g","contentUrl":"https:\/\/secure.gravatar.com\/avatar\/5081509054e28b04ecd976976e723ce0?s=96&d=mm&r=g","caption":"eeNews Europe"}}]}},"authors":[{"term_id":1149,"user_id":22,"is_guest":0,"slug":"eenews-europe","display_name":"eeNews Europe","avatar_url":"https:\/\/secure.gravatar.com\/avatar\/5081509054e28b04ecd976976e723ce0?s=96&d=mm&r=g","0":null,"1":"","2":"","3":"","4":"","5":"","6":"","7":"","8":""}],"_links":{"self":[{"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts\/227610"}],"collection":[{"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/users\/22"}],"replies":[{"embeddable":true,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/comments?post=227610"}],"version-history":[{"count":0,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts\/227610\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/media\/227611"}],"wp:attachment":[{"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/media?parent=227610"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/categories?post=227610"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/tags?post=227610"},{"taxonomy":"domains","embeddable":true,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/domains?post=227610"},{"taxonomy":"author","embeddable":true,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/ppma_author?post=227610"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}