{"id":216110,"date":"2016-03-29T01:14:50","date_gmt":"2016-03-29T01:14:50","guid":{"rendered":"https:\/\/eenewseurope.artwhere.co\/ni-ameliore-les-capacites-de-teststand-pour-le-test-de-semi-conducteurs\/"},"modified":"2016-03-29T01:14:50","modified_gmt":"2016-03-29T01:14:50","slug":"ni-ameliore-les-capacites-de-teststand-pour-le-test-de-semi-conducteurs","status":"publish","type":"post","link":"https:\/\/www.ecinews.fr\/fr\/ni-ameliore-les-capacites-de-teststand-pour-le-test-de-semi-conducteurs\/","title":{"rendered":"NI am\u00e9liore les capacit\u00e9s de TestStand pour le test de semi-conducteurs"},"content":{"rendered":"<p style=\"background:white\"><span>Avec le module TestStand Semiconductor, les ing\u00e9nieurs peuvent \u00e0 pr\u00e9sent programmer des syst\u00e8mes de caract\u00e9risation calqu\u00e9s sur le mod\u00e8le de programmation d\u00e9ploy\u00e9 en usine sur le Semiconductor Test System (STS), ce qui permet de r\u00e9duire le temps n\u00e9cessaire \u00e0 la corr\u00e9lation des mesures. <\/span><\/p>\n<p style=\"background:white\"><span>Reposant sur TestStand, le logiciel de gestion de tests standard de l&rsquo;industrie utilis\u00e9 par plus de 10 000 d\u00e9veloppeurs \u00e0 travers le monde, le module TestStand Semiconductor donne \u00e9galement la possibilit\u00e9 aux utilisateurs de d\u00e9velopper leurs propres syst\u00e8mes empilables en baie pour le test en production de semi-conducteurs, en d\u00e9tournant la technologie PXI et TestStand de l&rsquo;architecture \u00ab\u00a0t\u00eate d&rsquo;essai\u00a0\u00bb conventionnelle du STS.<\/span><\/p>\n<p style=\"background:white\"><span>\u00ab NI continue \u00e0 r\u00e9duire les co\u00fbts de test de semi-conducteurs avec des logiciels ouverts et du mat\u00e9riel modulaire \u00bb, d\u00e9clare Ron Wolfe, Vice-Pr\u00e9sident Test de semi-conducteurs chez NI. \u00ab En 2014, nous avons introduit le STS sur le march\u00e9, qui a enrichi la plate-forme PXI ouverte avec des fonctionnalit\u00e9s sp\u00e9cifiques aux semi-conducteurs. Aujourd&rsquo;hui, il est possible d&rsquo;optimiser l&rsquo;\u00e9laboration de tests en s&rsquo;appuyant sur le module TestStand, sp\u00e9cialement con\u00e7u pour r\u00e9pondre aux besoins de tests de semi-conducteurs, de la caract\u00e9risation \u00e0 la production. \u00bb<\/span><\/p>\n<p style=\"background:white\"><span>Le module TestStand Semiconductor offre des fonctionnalit\u00e9s sp\u00e9cifiques au test de semi-conducteurs qui engendrent une r\u00e9duction significative des co\u00fbts de d\u00e9veloppement et une augmentation de la capacit\u00e9 de production. Ces fonctionnalit\u00e9s incluent :<\/span><\/p>\n<p style=\"margin-left:36.0pt;text-indent:-18.0pt;background:white\"><span>&#8211;<\/span>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp; <span>Une programmation dynamique multisite pour r\u00e9utiliser du code sur plusieurs sites de test, selon le besoin&nbsp;;<\/span><\/p>\n<p style=\"margin-left:36.0pt;text-indent:-18.0pt;background:white\"><span>&#8211;<\/span>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp; <span>Un \u00e9diteur de mappage de broches incluant la technologie PXI et des instruments tiers&nbsp;;<\/span><\/p>\n<p style=\"margin-top:0cm;margin-right:0cm;margin-bottom:10.0pt;margin-left:36.0pt;text-indent:-18.0pt;background:white\"><span>&#8211;<\/span>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp; <span>Un processeur de r\u00e9sultats au format STDF pour l&rsquo;enregistrement de r\u00e9sultats de tests param\u00e9triques standard.<\/span><\/p>\n<p style=\"background:white\"><span>Le module TestStand Semiconductor Module enrichit encore la gamme NI d\u00e9di\u00e9e au test de semi-conducteurs, qui comprend d\u00e9j\u00e0 le STS, des centaines d&rsquo;instruments hautes performances au format PXI et un logiciel performant int\u00e9grant TestStand et LabVIEW. Les fabricants de semi-conducteurs s&rsquo;appuient sur l&rsquo;approche bas\u00e9e plate-forme de NI pour r\u00e9duire les co\u00fbts et accro\u00eetre les d\u00e9bits de tests RF et \u00e0 signaux mixtes.<\/span><\/p>\n<p style=\"background:white\"><a href=\"http:\/\/www.ni.com\/teststand\/semiconductor\"><span>www.ni.com\/teststand\/semiconductor<\/span><\/a><\/p>\n<p><span style=\"font-size:12.0pt\">&nbsp;<\/span><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Avec le lancement du module TestStand Semiconductor, NI offre de nouvelles fonctionnalit\u00e9s pour TestStand d\u00e9di\u00e9es aux \u00e9quipements multisites et \u00e0 la cr\u00e9ation de rapports, ainsi que des interfaces prober\/manipulateur pour obtenir des syst\u00e8mes de test plus intelligents. Le module TestStand Semiconductor comprend tous les outils logiciels n\u00e9cessaires pour d\u00e9velopper, d\u00e9ployer et maintenir rapidement des syst\u00e8mes de test de semi-conducteurs optimis\u00e9s.<\/p>\n","protected":false},"author":9,"featured_media":216111,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[],"tags":[],"domains":[47],"ppma_author":[1141],"class_list":["post-216110","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","domains-electronique-eci"],"acf":[],"yoast_head":"<title>NI am\u00e9liore les capacit\u00e9s de TestStand pour le test de semi-c...<\/title>\n<meta name=\"description\" content=\"Avec le lancement du module TestStand Semiconductor, NI offre de nouvelles fonctionnalit\u00e9s pour TestStand d\u00e9di\u00e9es aux \u00e9quipements multisites et \u00e0 la...\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts\/216110\/\" \/>\n<meta property=\"og:locale\" content=\"fr_FR\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"NI am\u00e9liore les capacit\u00e9s de TestStand pour le test de semi-conducteurs\" \/>\n<meta property=\"og:description\" content=\"Avec le lancement du module TestStand Semiconductor, NI offre de nouvelles fonctionnalit\u00e9s pour TestStand d\u00e9di\u00e9es aux \u00e9quipements multisites et \u00e0 la cr\u00e9ation de rapports, ainsi que des interfaces prober\/manipulateur pour obtenir des syst\u00e8mes de test plus intelligents. Le module TestStand Semiconductor comprend tous les outils logiciels n\u00e9cessaires pour d\u00e9velopper, d\u00e9ployer et maintenir rapidement des syst\u00e8mes de test de semi-conducteurs optimis\u00e9s.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts\/216110\/\" \/>\n<meta property=\"og:site_name\" content=\"EENewsEurope\" \/>\n<meta property=\"article:published_time\" content=\"2016-03-29T01:14:50+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/www.ecinews.fr\/wp-content\/uploads\/import\/default\/files\/sites\/default\/files\/images\/eci5041_ni.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"2136\" \/>\n\t<meta property=\"og:image:height\" content=\"1600\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"author\" content=\"Alain Dieul\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"Alain Dieul\" \/>\n\t<meta name=\"twitter:label2\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"2 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\/\/www.ecinews.fr\/fr\/ni-ameliore-les-capacites-de-teststand-pour-le-test-de-semi-conducteurs\/#article\",\"isPartOf\":{\"@id\":\"https:\/\/www.ecinews.fr\/fr\/ni-ameliore-les-capacites-de-teststand-pour-le-test-de-semi-conducteurs\/\"},\"author\":{\"name\":\"Alain Dieul\",\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#\/schema\/person\/568c789a4794bd460460501ba91f5daf\"},\"headline\":\"NI am\u00e9liore les capacit\u00e9s de TestStand pour le test de semi-conducteurs\",\"datePublished\":\"2016-03-29T01:14:50+00:00\",\"dateModified\":\"2016-03-29T01:14:50+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\/\/www.ecinews.fr\/fr\/ni-ameliore-les-capacites-de-teststand-pour-le-test-de-semi-conducteurs\/\"},\"wordCount\":413,\"publisher\":{\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#organization\"},\"inLanguage\":\"fr-FR\"},{\"@type\":\"WebPage\",\"@id\":\"https:\/\/www.ecinews.fr\/fr\/ni-ameliore-les-capacites-de-teststand-pour-le-test-de-semi-conducteurs\/\",\"url\":\"https:\/\/www.ecinews.fr\/fr\/ni-ameliore-les-capacites-de-teststand-pour-le-test-de-semi-conducteurs\/\",\"name\":\"NI am\u00e9liore les capacit\u00e9s de TestStand pour le test de semi-conducteurs -\",\"isPartOf\":{\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#website\"},\"datePublished\":\"2016-03-29T01:14:50+00:00\",\"dateModified\":\"2016-03-29T01:14:50+00:00\",\"breadcrumb\":{\"@id\":\"https:\/\/www.ecinews.fr\/fr\/ni-ameliore-les-capacites-de-teststand-pour-le-test-de-semi-conducteurs\/#breadcrumb\"},\"inLanguage\":\"fr-FR\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\/\/www.ecinews.fr\/fr\/ni-ameliore-les-capacites-de-teststand-pour-le-test-de-semi-conducteurs\/\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\/\/www.ecinews.fr\/fr\/ni-ameliore-les-capacites-de-teststand-pour-le-test-de-semi-conducteurs\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\/\/test.eenewseurope.com\/fr\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"NI am\u00e9liore les capacit\u00e9s de TestStand pour le test de semi-conducteurs\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#website\",\"url\":\"https:\/\/www.eenewseurope.com\/en\/\",\"name\":\"EENewsEurope\",\"description\":\"Just another WordPress site\",\"publisher\":{\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\/\/www.eenewseurope.com\/en\/?s={search_term_string}\"},\"query-input\":\"required name=search_term_string\"}],\"inLanguage\":\"fr-FR\"},{\"@type\":\"Organization\",\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#organization\",\"name\":\"EENewsEurope\",\"url\":\"https:\/\/www.eenewseurope.com\/en\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"fr-FR\",\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#\/schema\/logo\/image\/\",\"url\":\"https:\/\/www.ecinews.fr\/wp-content\/uploads\/2022\/02\/logo-1.jpg\",\"contentUrl\":\"https:\/\/www.ecinews.fr\/wp-content\/uploads\/2022\/02\/logo-1.jpg\",\"width\":283,\"height\":113,\"caption\":\"EENewsEurope\"},\"image\":{\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#\/schema\/logo\/image\/\"}},{\"@type\":\"Person\",\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#\/schema\/person\/568c789a4794bd460460501ba91f5daf\",\"name\":\"Alain Dieul\",\"image\":{\"@type\":\"ImageObject\",\"inLanguage\":\"fr-FR\",\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#\/schema\/person\/image\/6d32dc651fbcef3b338066625b118364\",\"url\":\"https:\/\/secure.gravatar.com\/avatar\/93708ec89b35deb10f4cfbfe144b4e07?s=96&d=mm&r=g\",\"contentUrl\":\"https:\/\/secure.gravatar.com\/avatar\/93708ec89b35deb10f4cfbfe144b4e07?s=96&d=mm&r=g\",\"caption\":\"Alain Dieul\"}}]}<\/script>","yoast_head_json":{"title":"NI am\u00e9liore les capacit\u00e9s de TestStand pour le test de semi-c...","description":"Avec le lancement du module TestStand Semiconductor, NI offre de nouvelles fonctionnalit\u00e9s pour TestStand d\u00e9di\u00e9es aux \u00e9quipements multisites et \u00e0 la...","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts\/216110\/","og_locale":"fr_FR","og_type":"article","og_title":"NI am\u00e9liore les capacit\u00e9s de TestStand pour le test de semi-conducteurs","og_description":"Avec le lancement du module TestStand Semiconductor, NI offre de nouvelles fonctionnalit\u00e9s pour TestStand d\u00e9di\u00e9es aux \u00e9quipements multisites et \u00e0 la cr\u00e9ation de rapports, ainsi que des interfaces prober\/manipulateur pour obtenir des syst\u00e8mes de test plus intelligents. Le module TestStand Semiconductor comprend tous les outils logiciels n\u00e9cessaires pour d\u00e9velopper, d\u00e9ployer et maintenir rapidement des syst\u00e8mes de test de semi-conducteurs optimis\u00e9s.","og_url":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts\/216110\/","og_site_name":"EENewsEurope","article_published_time":"2016-03-29T01:14:50+00:00","og_image":[{"width":2136,"height":1600,"url":"https:\/\/www.ecinews.fr\/wp-content\/uploads\/import\/default\/files\/sites\/default\/files\/images\/eci5041_ni.jpg","type":"image\/jpeg"}],"author":"Alain Dieul","twitter_card":"summary_large_image","twitter_misc":{"Written by":"Alain Dieul","Est. reading time":"2 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/www.ecinews.fr\/fr\/ni-ameliore-les-capacites-de-teststand-pour-le-test-de-semi-conducteurs\/#article","isPartOf":{"@id":"https:\/\/www.ecinews.fr\/fr\/ni-ameliore-les-capacites-de-teststand-pour-le-test-de-semi-conducteurs\/"},"author":{"name":"Alain Dieul","@id":"https:\/\/www.eenewseurope.com\/en\/#\/schema\/person\/568c789a4794bd460460501ba91f5daf"},"headline":"NI am\u00e9liore les capacit\u00e9s de TestStand pour le test de semi-conducteurs","datePublished":"2016-03-29T01:14:50+00:00","dateModified":"2016-03-29T01:14:50+00:00","mainEntityOfPage":{"@id":"https:\/\/www.ecinews.fr\/fr\/ni-ameliore-les-capacites-de-teststand-pour-le-test-de-semi-conducteurs\/"},"wordCount":413,"publisher":{"@id":"https:\/\/www.eenewseurope.com\/en\/#organization"},"inLanguage":"fr-FR"},{"@type":"WebPage","@id":"https:\/\/www.ecinews.fr\/fr\/ni-ameliore-les-capacites-de-teststand-pour-le-test-de-semi-conducteurs\/","url":"https:\/\/www.ecinews.fr\/fr\/ni-ameliore-les-capacites-de-teststand-pour-le-test-de-semi-conducteurs\/","name":"NI am\u00e9liore les capacit\u00e9s de TestStand pour le test de semi-conducteurs -","isPartOf":{"@id":"https:\/\/www.eenewseurope.com\/en\/#website"},"datePublished":"2016-03-29T01:14:50+00:00","dateModified":"2016-03-29T01:14:50+00:00","breadcrumb":{"@id":"https:\/\/www.ecinews.fr\/fr\/ni-ameliore-les-capacites-de-teststand-pour-le-test-de-semi-conducteurs\/#breadcrumb"},"inLanguage":"fr-FR","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.ecinews.fr\/fr\/ni-ameliore-les-capacites-de-teststand-pour-le-test-de-semi-conducteurs\/"]}]},{"@type":"BreadcrumbList","@id":"https:\/\/www.ecinews.fr\/fr\/ni-ameliore-les-capacites-de-teststand-pour-le-test-de-semi-conducteurs\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/test.eenewseurope.com\/fr\/"},{"@type":"ListItem","position":2,"name":"NI am\u00e9liore les capacit\u00e9s de TestStand pour le test de semi-conducteurs"}]},{"@type":"WebSite","@id":"https:\/\/www.eenewseurope.com\/en\/#website","url":"https:\/\/www.eenewseurope.com\/en\/","name":"EENewsEurope","description":"Just another WordPress site","publisher":{"@id":"https:\/\/www.eenewseurope.com\/en\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.eenewseurope.com\/en\/?s={search_term_string}"},"query-input":"required name=search_term_string"}],"inLanguage":"fr-FR"},{"@type":"Organization","@id":"https:\/\/www.eenewseurope.com\/en\/#organization","name":"EENewsEurope","url":"https:\/\/www.eenewseurope.com\/en\/","logo":{"@type":"ImageObject","inLanguage":"fr-FR","@id":"https:\/\/www.eenewseurope.com\/en\/#\/schema\/logo\/image\/","url":"https:\/\/www.ecinews.fr\/wp-content\/uploads\/2022\/02\/logo-1.jpg","contentUrl":"https:\/\/www.ecinews.fr\/wp-content\/uploads\/2022\/02\/logo-1.jpg","width":283,"height":113,"caption":"EENewsEurope"},"image":{"@id":"https:\/\/www.eenewseurope.com\/en\/#\/schema\/logo\/image\/"}},{"@type":"Person","@id":"https:\/\/www.eenewseurope.com\/en\/#\/schema\/person\/568c789a4794bd460460501ba91f5daf","name":"Alain Dieul","image":{"@type":"ImageObject","inLanguage":"fr-FR","@id":"https:\/\/www.eenewseurope.com\/en\/#\/schema\/person\/image\/6d32dc651fbcef3b338066625b118364","url":"https:\/\/secure.gravatar.com\/avatar\/93708ec89b35deb10f4cfbfe144b4e07?s=96&d=mm&r=g","contentUrl":"https:\/\/secure.gravatar.com\/avatar\/93708ec89b35deb10f4cfbfe144b4e07?s=96&d=mm&r=g","caption":"Alain Dieul"}}]}},"authors":[{"term_id":1141,"user_id":9,"is_guest":0,"slug":"alaindieul","display_name":"Alain Dieul","avatar_url":"https:\/\/secure.gravatar.com\/avatar\/93708ec89b35deb10f4cfbfe144b4e07?s=96&d=mm&r=g","0":null,"1":"","2":"","3":"","4":"","5":"","6":"","7":"","8":""}],"_links":{"self":[{"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts\/216110"}],"collection":[{"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/users\/9"}],"replies":[{"embeddable":true,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/comments?post=216110"}],"version-history":[{"count":0,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts\/216110\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/media\/216111"}],"wp:attachment":[{"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/media?parent=216110"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/categories?post=216110"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/tags?post=216110"},{"taxonomy":"domains","embeddable":true,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/domains?post=216110"},{"taxonomy":"author","embeddable":true,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/ppma_author?post=216110"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}