{"id":211384,"date":"2016-05-11T06:00:00","date_gmt":"2016-05-11T06:00:00","guid":{"rendered":"https:\/\/eenewseurope.artwhere.co\/outils-ameliorant-les-capacites-de-test-pour-lintegrite-de-signal-sur-les-systemes-haut-debits\/"},"modified":"2016-05-11T06:00:00","modified_gmt":"2016-05-11T06:00:00","slug":"outils-ameliorant-les-capacites-de-test-pour-lintegrite-de-signal-sur-les-systemes-haut-debits","status":"publish","type":"post","link":"https:\/\/www.ecinews.fr\/fr\/outils-ameliorant-les-capacites-de-test-pour-lintegrite-de-signal-sur-les-systemes-haut-debits\/","title":{"rendered":"Outils am\u00e9liorant les capacit\u00e9s de test pour l\u2019int\u00e9grit\u00e9 de signal sur les syst\u00e8mes haut-d\u00e9bits"},"content":{"rendered":"<p>Gr\u00e2ce \u00e0 l\u2019ajout des fonctions de diagramme de l&rsquo;\u0153il sur les VectorStar et ATD sur les ShockLine, les ing\u00e9nieurs poss\u00e8dent plus d\u2019outils pour respecter les exigences des syst\u00e8mes SI et de mod\u00e9lisation de canaux Datacom.<\/p>\n<p>\u00ab\u00a0\u00c0 mesure que les d\u00e9bits de donn\u00e9s continuent d\u2019augmenter, la caract\u00e9risation des canaux de communication de signal devient de plus en plus difficile \u00e0 r\u00e9aliser. R\u00e9sultat&nbsp;: les analyseurs de r\u00e9seaux vectoriels, ou VNA deviennent indispensables pour la mesure de l\u2019int\u00e9grit\u00e9 du signal, si bien que les capacit\u00e9s suppl\u00e9mentaires en mati\u00e8re de traitement et de visualisation des donn\u00e9es soient un plus. Pour toutes ces raisons, plusieurs outils ont \u00e9t\u00e9 ajout\u00e9s aux familles de VNA VectorStar et Shockline qui peuvent aider les ing\u00e9nieurs sp\u00e9cialis\u00e9s en int\u00e9grit\u00e9 du signal \u00e0 \u00eatre plus efficaces dans leurs analyses,\u00a0\u00bb explique le docteur Jon Martens, chercheur chez Anritsu.<\/p>\n<p>Ces familles d\u2019analyseurs de r\u00e9seau vectoriels offrent ainsi des possibilit\u00e9s compl\u00e9mentaires qui permettent aux ing\u00e9nieurs SI de r\u00e9aliser leurs mesures sur un large \u00e9ventail d\u2019applications.<br \/>\nLe VectorStar, le VNA plus performant de la gamme, est souvent utilis\u00e9 par les ing\u00e9nieurs SI confront\u00e9s aux exigences de conception les plus complexes. Par exemple, certains concepteurs veulent que leurs syst\u00e8mes de test puissent inclure jusqu\u2019\u00e0 la 5\u00e8me harmonique de leur horloge syst\u00e8me. Cet analyseur offre des configurations \u00e0 large bande \u00e0 2 et 4&nbsp;ports allant de 70&nbsp;kHz \u00e0 70&nbsp;GHz, 110 GHz et 145&nbsp;GHz avec une seule connexion coaxiale, supportant les derniers d\u00e9bits de donn\u00e9es num\u00e9riques, y compris le standard CEI 50\/56G.<br \/>\nLa famille de VNA ShockLine qui affiche \u00e9galement d\u2019excellentes performances mais int\u00e8gre moins de capacit\u00e9s pour un co\u00fbt plus \u00e9conomique, convient pour des applications SI moins exigeantes. Ils sont donc bien adapt\u00e9s pour les syst\u00e8mes \u00e0 d\u00e9bits de donn\u00e9es inf\u00e9rieurs ou pour les applications industrielles.&nbsp;<\/p>\n<p><a href=\"http:\/\/www.anritsu.com\/en-GB\/home.aspx\" target=\"_blank\" rel=\"noopener\">www.anritsu.com<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Afin de fournir aux ing\u00e9nieurs sp\u00e9cialis\u00e9s en int\u00e9grit\u00e9 de signal (SI) des outils am\u00e9lior\u00e9s pour r\u00e9aliser les diagnostics de canaux et valider des mod\u00e8les de syst\u00e8mes \u00e0 circuit num\u00e9rique haut d\u00e9bit, Anritsu \u00e9tend les capacit\u00e9s SI de ses analyseurs de r\u00e9seau vectoriels (VNA) VectorStar et ShockLine avec, respectivement, les fonctions de diagramme de l\u2019\u0153il et Advanced Time Domain (ATD).<\/p>\n","protected":false},"author":9,"featured_media":211385,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[881],"tags":[911],"domains":[47],"ppma_author":[1141],"class_list":["post-211384","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-nouveaux-produits","tag-testandmeasurement-fr","domains-electronique-eci"],"acf":[],"yoast_head":"<title>Outils am\u00e9liorant les capacit\u00e9s de test pour l\u2019int\u00e9grit\u00e9 ...<\/title>\n<meta name=\"description\" content=\"Afin de fournir aux ing\u00e9nieurs sp\u00e9cialis\u00e9s en int\u00e9grit\u00e9 de signal (SI) des outils am\u00e9lior\u00e9s pour r\u00e9aliser les diagnostics de canaux et valider des...\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts\/211384\/\" \/>\n<meta property=\"og:locale\" content=\"fr_FR\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Outils am\u00e9liorant les capacit\u00e9s de test pour l\u2019int\u00e9grit\u00e9 de signal sur les syst\u00e8mes haut-d\u00e9bits\" \/>\n<meta property=\"og:description\" content=\"Afin de fournir aux ing\u00e9nieurs sp\u00e9cialis\u00e9s en int\u00e9grit\u00e9 de signal (SI) des outils am\u00e9lior\u00e9s pour r\u00e9aliser les diagnostics de canaux et valider des mod\u00e8les de syst\u00e8mes \u00e0 circuit num\u00e9rique haut d\u00e9bit, Anritsu \u00e9tend les capacit\u00e9s SI de ses analyseurs de r\u00e9seau vectoriels (VNA) VectorStar et ShockLine avec, respectivement, les fonctions de diagramme de l\u2019\u0153il et Advanced Time Domain (ATD).\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts\/211384\/\" \/>\n<meta property=\"og:site_name\" content=\"EENewsEurope\" \/>\n<meta property=\"article:published_time\" content=\"2016-05-11T06:00:00+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/www.eenewseurope.com\/wp-content\/uploads\/import\/default\/files\/sites\/default\/files\/images\/eci7850_anritsu_pam4_r.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"776\" \/>\n\t<meta property=\"og:image:height\" content=\"532\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"author\" content=\"Alain Dieul\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"Alain Dieul\" \/>\n\t<meta name=\"twitter:label2\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"2 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\/\/www.eenewseurope.com\/fr\/outils-ameliorant-les-capacites-de-test-pour-lintegrite-de-signal-sur-les-systemes-haut-debits\/#article\",\"isPartOf\":{\"@id\":\"https:\/\/www.eenewseurope.com\/fr\/outils-ameliorant-les-capacites-de-test-pour-lintegrite-de-signal-sur-les-systemes-haut-debits\/\"},\"author\":{\"name\":\"Alain Dieul\",\"@id\":\"https:\/\/www.ecinews.fr\/fr\/#\/schema\/person\/568c789a4794bd460460501ba91f5daf\"},\"headline\":\"Outils am\u00e9liorant les capacit\u00e9s de test pour l\u2019int\u00e9grit\u00e9 de signal sur les syst\u00e8mes haut-d\u00e9bits\",\"datePublished\":\"2016-05-11T06:00:00+00:00\",\"dateModified\":\"2016-05-11T06:00:00+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\/\/www.eenewseurope.com\/fr\/outils-ameliorant-les-capacites-de-test-pour-lintegrite-de-signal-sur-les-systemes-haut-debits\/\"},\"wordCount\":357,\"publisher\":{\"@id\":\"https:\/\/www.ecinews.fr\/fr\/#organization\"},\"keywords\":[\"TestandMeasurement\"],\"articleSection\":[\"Nouveaux produits\"],\"inLanguage\":\"fr-FR\"},{\"@type\":\"WebPage\",\"@id\":\"https:\/\/www.eenewseurope.com\/fr\/outils-ameliorant-les-capacites-de-test-pour-lintegrite-de-signal-sur-les-systemes-haut-debits\/\",\"url\":\"https:\/\/www.eenewseurope.com\/fr\/outils-ameliorant-les-capacites-de-test-pour-lintegrite-de-signal-sur-les-systemes-haut-debits\/\",\"name\":\"Outils am\u00e9liorant les capacit\u00e9s de test pour l\u2019int\u00e9grit\u00e9 de signal sur les syst\u00e8mes haut-d\u00e9bits -\",\"isPartOf\":{\"@id\":\"https:\/\/www.ecinews.fr\/fr\/#website\"},\"datePublished\":\"2016-05-11T06:00:00+00:00\",\"dateModified\":\"2016-05-11T06:00:00+00:00\",\"breadcrumb\":{\"@id\":\"https:\/\/www.eenewseurope.com\/fr\/outils-ameliorant-les-capacites-de-test-pour-lintegrite-de-signal-sur-les-systemes-haut-debits\/#breadcrumb\"},\"inLanguage\":\"fr-FR\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\/\/www.eenewseurope.com\/fr\/outils-ameliorant-les-capacites-de-test-pour-lintegrite-de-signal-sur-les-systemes-haut-debits\/\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\/\/www.eenewseurope.com\/fr\/outils-ameliorant-les-capacites-de-test-pour-lintegrite-de-signal-sur-les-systemes-haut-debits\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\/\/www.ecinews.fr\/fr\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Outils am\u00e9liorant les capacit\u00e9s de test pour l\u2019int\u00e9grit\u00e9 de signal sur les syst\u00e8mes haut-d\u00e9bits\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\/\/www.ecinews.fr\/fr\/#website\",\"url\":\"https:\/\/www.ecinews.fr\/fr\/\",\"name\":\"EENewsEurope\",\"description\":\"Just another WordPress site\",\"publisher\":{\"@id\":\"https:\/\/www.ecinews.fr\/fr\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\/\/www.ecinews.fr\/fr\/?s={search_term_string}\"},\"query-input\":\"required name=search_term_string\"}],\"inLanguage\":\"fr-FR\"},{\"@type\":\"Organization\",\"@id\":\"https:\/\/www.ecinews.fr\/fr\/#organization\",\"name\":\"EENewsEurope\",\"url\":\"https:\/\/www.ecinews.fr\/fr\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"fr-FR\",\"@id\":\"https:\/\/www.ecinews.fr\/fr\/#\/schema\/logo\/image\/\",\"url\":\"https:\/\/www.ecinews.fr\/wp-content\/uploads\/2022\/02\/logo-1.jpg\",\"contentUrl\":\"https:\/\/www.ecinews.fr\/wp-content\/uploads\/2022\/02\/logo-1.jpg\",\"width\":283,\"height\":113,\"caption\":\"EENewsEurope\"},\"image\":{\"@id\":\"https:\/\/www.ecinews.fr\/fr\/#\/schema\/logo\/image\/\"}},{\"@type\":\"Person\",\"@id\":\"https:\/\/www.ecinews.fr\/fr\/#\/schema\/person\/568c789a4794bd460460501ba91f5daf\",\"name\":\"Alain Dieul\",\"image\":{\"@type\":\"ImageObject\",\"inLanguage\":\"fr-FR\",\"@id\":\"https:\/\/www.ecinews.fr\/fr\/#\/schema\/person\/image\/6d32dc651fbcef3b338066625b118364\",\"url\":\"https:\/\/secure.gravatar.com\/avatar\/93708ec89b35deb10f4cfbfe144b4e07?s=96&d=mm&r=g\",\"contentUrl\":\"https:\/\/secure.gravatar.com\/avatar\/93708ec89b35deb10f4cfbfe144b4e07?s=96&d=mm&r=g\",\"caption\":\"Alain Dieul\"}}]}<\/script>","yoast_head_json":{"title":"Outils am\u00e9liorant les capacit\u00e9s de test pour l\u2019int\u00e9grit\u00e9 ...","description":"Afin de fournir aux ing\u00e9nieurs sp\u00e9cialis\u00e9s en int\u00e9grit\u00e9 de signal (SI) des outils am\u00e9lior\u00e9s pour r\u00e9aliser les diagnostics de canaux et valider des...","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts\/211384\/","og_locale":"fr_FR","og_type":"article","og_title":"Outils am\u00e9liorant les capacit\u00e9s de test pour l\u2019int\u00e9grit\u00e9 de signal sur les syst\u00e8mes haut-d\u00e9bits","og_description":"Afin de fournir aux ing\u00e9nieurs sp\u00e9cialis\u00e9s en int\u00e9grit\u00e9 de signal (SI) des outils am\u00e9lior\u00e9s pour r\u00e9aliser les diagnostics de canaux et valider des mod\u00e8les de syst\u00e8mes \u00e0 circuit num\u00e9rique haut d\u00e9bit, Anritsu \u00e9tend les capacit\u00e9s SI de ses analyseurs de r\u00e9seau vectoriels (VNA) VectorStar et ShockLine avec, respectivement, les fonctions de diagramme de l\u2019\u0153il et Advanced Time Domain (ATD).","og_url":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts\/211384\/","og_site_name":"EENewsEurope","article_published_time":"2016-05-11T06:00:00+00:00","og_image":[{"width":776,"height":532,"url":"https:\/\/www.eenewseurope.com\/wp-content\/uploads\/import\/default\/files\/sites\/default\/files\/images\/eci7850_anritsu_pam4_r.jpg","type":"image\/jpeg"}],"author":"Alain Dieul","twitter_card":"summary_large_image","twitter_misc":{"Written by":"Alain Dieul","Est. reading time":"2 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/www.eenewseurope.com\/fr\/outils-ameliorant-les-capacites-de-test-pour-lintegrite-de-signal-sur-les-systemes-haut-debits\/#article","isPartOf":{"@id":"https:\/\/www.eenewseurope.com\/fr\/outils-ameliorant-les-capacites-de-test-pour-lintegrite-de-signal-sur-les-systemes-haut-debits\/"},"author":{"name":"Alain Dieul","@id":"https:\/\/www.ecinews.fr\/fr\/#\/schema\/person\/568c789a4794bd460460501ba91f5daf"},"headline":"Outils am\u00e9liorant les capacit\u00e9s de test pour l\u2019int\u00e9grit\u00e9 de signal sur les syst\u00e8mes haut-d\u00e9bits","datePublished":"2016-05-11T06:00:00+00:00","dateModified":"2016-05-11T06:00:00+00:00","mainEntityOfPage":{"@id":"https:\/\/www.eenewseurope.com\/fr\/outils-ameliorant-les-capacites-de-test-pour-lintegrite-de-signal-sur-les-systemes-haut-debits\/"},"wordCount":357,"publisher":{"@id":"https:\/\/www.ecinews.fr\/fr\/#organization"},"keywords":["TestandMeasurement"],"articleSection":["Nouveaux produits"],"inLanguage":"fr-FR"},{"@type":"WebPage","@id":"https:\/\/www.eenewseurope.com\/fr\/outils-ameliorant-les-capacites-de-test-pour-lintegrite-de-signal-sur-les-systemes-haut-debits\/","url":"https:\/\/www.eenewseurope.com\/fr\/outils-ameliorant-les-capacites-de-test-pour-lintegrite-de-signal-sur-les-systemes-haut-debits\/","name":"Outils am\u00e9liorant les capacit\u00e9s de test pour l\u2019int\u00e9grit\u00e9 de signal sur les syst\u00e8mes haut-d\u00e9bits -","isPartOf":{"@id":"https:\/\/www.ecinews.fr\/fr\/#website"},"datePublished":"2016-05-11T06:00:00+00:00","dateModified":"2016-05-11T06:00:00+00:00","breadcrumb":{"@id":"https:\/\/www.eenewseurope.com\/fr\/outils-ameliorant-les-capacites-de-test-pour-lintegrite-de-signal-sur-les-systemes-haut-debits\/#breadcrumb"},"inLanguage":"fr-FR","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.eenewseurope.com\/fr\/outils-ameliorant-les-capacites-de-test-pour-lintegrite-de-signal-sur-les-systemes-haut-debits\/"]}]},{"@type":"BreadcrumbList","@id":"https:\/\/www.eenewseurope.com\/fr\/outils-ameliorant-les-capacites-de-test-pour-lintegrite-de-signal-sur-les-systemes-haut-debits\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/www.ecinews.fr\/fr\/"},{"@type":"ListItem","position":2,"name":"Outils am\u00e9liorant les capacit\u00e9s de test pour l\u2019int\u00e9grit\u00e9 de signal sur les syst\u00e8mes haut-d\u00e9bits"}]},{"@type":"WebSite","@id":"https:\/\/www.ecinews.fr\/fr\/#website","url":"https:\/\/www.ecinews.fr\/fr\/","name":"EENewsEurope","description":"Just another WordPress site","publisher":{"@id":"https:\/\/www.ecinews.fr\/fr\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.ecinews.fr\/fr\/?s={search_term_string}"},"query-input":"required name=search_term_string"}],"inLanguage":"fr-FR"},{"@type":"Organization","@id":"https:\/\/www.ecinews.fr\/fr\/#organization","name":"EENewsEurope","url":"https:\/\/www.ecinews.fr\/fr\/","logo":{"@type":"ImageObject","inLanguage":"fr-FR","@id":"https:\/\/www.ecinews.fr\/fr\/#\/schema\/logo\/image\/","url":"https:\/\/www.ecinews.fr\/wp-content\/uploads\/2022\/02\/logo-1.jpg","contentUrl":"https:\/\/www.ecinews.fr\/wp-content\/uploads\/2022\/02\/logo-1.jpg","width":283,"height":113,"caption":"EENewsEurope"},"image":{"@id":"https:\/\/www.ecinews.fr\/fr\/#\/schema\/logo\/image\/"}},{"@type":"Person","@id":"https:\/\/www.ecinews.fr\/fr\/#\/schema\/person\/568c789a4794bd460460501ba91f5daf","name":"Alain Dieul","image":{"@type":"ImageObject","inLanguage":"fr-FR","@id":"https:\/\/www.ecinews.fr\/fr\/#\/schema\/person\/image\/6d32dc651fbcef3b338066625b118364","url":"https:\/\/secure.gravatar.com\/avatar\/93708ec89b35deb10f4cfbfe144b4e07?s=96&d=mm&r=g","contentUrl":"https:\/\/secure.gravatar.com\/avatar\/93708ec89b35deb10f4cfbfe144b4e07?s=96&d=mm&r=g","caption":"Alain Dieul"}}]}},"authors":[{"term_id":1141,"user_id":9,"is_guest":0,"slug":"alaindieul","display_name":"Alain Dieul","avatar_url":"https:\/\/secure.gravatar.com\/avatar\/93708ec89b35deb10f4cfbfe144b4e07?s=96&d=mm&r=g","0":null,"1":"","2":"","3":"","4":"","5":"","6":"","7":"","8":""}],"_links":{"self":[{"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts\/211384"}],"collection":[{"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/users\/9"}],"replies":[{"embeddable":true,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/comments?post=211384"}],"version-history":[{"count":0,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts\/211384\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/media\/211385"}],"wp:attachment":[{"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/media?parent=211384"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/categories?post=211384"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/tags?post=211384"},{"taxonomy":"domains","embeddable":true,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/domains?post=211384"},{"taxonomy":"author","embeddable":true,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/ppma_author?post=211384"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}