{"id":208381,"date":"2016-06-06T22:53:00","date_gmt":"2016-06-06T22:53:00","guid":{"rendered":"https:\/\/eenewseurope.artwhere.co\/ni-et-hpe-annoncent-une-solution-pre-testee-pour-analyser-des-donnees-chronologiques-de-capteurs\/"},"modified":"2016-06-06T22:53:00","modified_gmt":"2016-06-06T22:53:00","slug":"ni-et-hpe-annoncent-une-solution-pre-testee-pour-analyser-des-donnees-chronologiques-de-capteurs","status":"publish","type":"post","link":"https:\/\/www.ecinews.fr\/fr\/ni-et-hpe-annoncent-une-solution-pre-testee-pour-analyser-des-donnees-chronologiques-de-capteurs\/","title":{"rendered":"NI et HPE annoncent une solution pr\u00e9-test\u00e9e pour analyser des donn\u00e9es chronologiques de capteurs"},"content":{"rendered":"<p>Les ing\u00e9nieurs sont aujourd&rsquo;hui confront\u00e9s \u00e0 des donn\u00e9es de capteurs tr\u00e8s diff\u00e9rentes de celles collect\u00e9es et g\u00e9r\u00e9es jusqu&rsquo;ici par les solutions Big Data traditionnelles. La collaboration entre ces deux entreprises devrait aboutir \u00e0 la mise \u00e0 disposition d&rsquo;une solution logicielle et mat\u00e9rielle pr\u00e9-test\u00e9e de pointe, destin\u00e9e \u00e0 r\u00e9soudre les probl\u00e8mes de gestion de donn\u00e9es et \u00e0 faciliter la prise de d\u00e9cisions avis\u00e9es \u00e0 partir de donn\u00e9es de capteurs.<\/p>\n<p>\u00ab\u00a0La solution Big Analog Data DataFinder-Moonshot est une combinaison puissante qui permettra aux ing\u00e9nieurs de d\u00e9ployer rapidement leurs syst\u00e8mes et d&rsquo;obtenir des informations strat\u00e9giques \u00e0 partir de donn\u00e9es de production, de test et de l&rsquo;Internet des objets,\u00a0\u00bb explique Dr Tom Bradicich, Vice-pr\u00e9sident et directeur g\u00e9n\u00e9ral du service Serveurs hyperscales et syst\u00e8mes IoT chez HPE. \u00ab\u00a0Avec cette solution pr\u00e9-test\u00e9e, HPE et NI aident leurs clients \u00e0 r\u00e9duire les risques li\u00e9s \u00e0 l&rsquo;int\u00e9gration.\u00a0\u00bb<\/p>\n<p>L&rsquo;association des syst\u00e8mes HPE Moonshot et de DataFinder Server Edition fournit aux ing\u00e9nieurs une solution compl\u00e8te, pr\u00e9-valid\u00e9e et test\u00e9e, d\u00e9di\u00e9e \u00e0 la gestion et \u00e0 l&rsquo;analyse souvent probl\u00e9matiques des donn\u00e9es de capteurs sur fichiers. En utilisant le logiciel DataFinder Server Edition sur les serveurs lames HPE Moonshoot, les utilisateurs peuvent g\u00e9rer des donn\u00e9es, structur\u00e9es ou non, g\u00e9n\u00e9r\u00e9es par n&rsquo;importe quel n\u0153ud d&rsquo;analyse ou d&rsquo;acquisition.<\/p>\n<p>\u00ab\u00a0Avec l&rsquo;IoT et l&rsquo;\u00e9mergence de syst\u00e8mes plus connect\u00e9s, nos clients n&rsquo;ont jamais collect\u00e9 autant de donn\u00e9es qu&rsquo;aujourd&rsquo;hui,\u00a0\u00bb d\u00e9clare Eric Starkloff, Vice-pr\u00e9sident ex\u00e9cutif Ventes et Marketing chez NI. \u00ab\u00a0Si nous leur donnons la possibilit\u00e9 d&rsquo;analyser leurs donn\u00e9es de mani\u00e8re plus fiable et plus pr\u00e9cise, nos clients pourront mieux documenter les r\u00e9sultats de leurs tests et prendre les mesures ad\u00e9quates pour optimiser l&rsquo;efficacit\u00e9 de leurs applications.\u00a0\u00bb<\/p>\n<p>Cette technologie sera pr\u00e9sent\u00e9e lors de la conf\u00e9rence HPE Discover \u00e0 Las Vegas du 7 au 9&nbsp;juin, et lors du NIWeek qui se tiendra du 1er au 4&nbsp;ao\u00fbt \u00e0 Austin (Texas).<\/p>\n<p><a href=\"http:\/\/www.ni.com\/big-analog-data\/\" target=\"_blank\" rel=\"noopener\">www.ni.com\/big-analog-data<\/a><\/p>\n<p><a href=\"http:\/\/www.ni.com\/datafinder\" target=\"_blank\" rel=\"noopener\">www.ni.com\/datafinder<\/a><\/p>\n<p><a href=\"http:\/\/www.hpe.com\/info\/moonshot\" target=\"_blank\" rel=\"noopener\">www.hpe.com\/info\/moonshot<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>National Instruments (NI) et Hewlett Packard Enterprise (HPE) ont annonc\u00e9 leur collaboration pour faciliter l&rsquo;acc\u00e8s \u00e0 des solutions Big Analog Data reposant sur le logiciel NI DataFinder Server Edition et les syst\u00e8mes HPE Moonshot.<\/p>\n","protected":false},"author":9,"featured_media":208382,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[],"tags":[],"domains":[47],"ppma_author":[1141],"class_list":["post-208381","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","domains-electronique-eci"],"acf":[],"yoast_head":"<title>NI et HPE annoncent une solution pr\u00e9-test\u00e9e pour analyser des...<\/title>\n<meta name=\"description\" content=\"National Instruments (NI) et Hewlett Packard Enterprise (HPE) ont annonc\u00e9 leur collaboration pour faciliter l&#039;acc\u00e8s \u00e0 des solutions Big Analog Data...\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts\/208381\/\" \/>\n<meta property=\"og:locale\" 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