{"id":143994,"date":"2017-09-21T00:31:44","date_gmt":"2017-09-21T00:31:44","guid":{"rendered":"https:\/\/\/zuken-annonce-le-lancement-de-xjtag-dft-assistant-pour-la-suite-logicielle-cr-8000-de-conception-pcb\/"},"modified":"2017-09-21T00:31:44","modified_gmt":"2017-09-21T00:31:44","slug":"zuken-annonce-le-lancement-de-xjtag-dft-assistant-pour-la-suite-logicielle-cr-8000-de-conception-pcb","status":"publish","type":"post","link":"https:\/\/www.ecinews.fr\/fr\/zuken-annonce-le-lancement-de-xjtag-dft-assistant-pour-la-suite-logicielle-cr-8000-de-conception-pcb\/","title":{"rendered":"Zuken annonce le lancement de XJTAG DFT Assistant pour la suite logicielle CR-8000 de conception PCB"},"content":{"rendered":"<p>Cette capacit\u00e9 repose sur l\u2019outil XJTAG DFT Assistant, et sera disponible avant la fin de cette ann\u00e9e sous la forme d\u2019un module compl\u00e9mentaire gratuit pour les utilisateurs de l\u2019outil CR-8000 Design Gateway de Zuken. CR-8000 Design Gateway est la plateforme de conception et de v\u00e9rification de circuits logiques de Zuken. il s\u2019agit d\u2019une plate-forme native 3D de conception de syst\u00e8mes \u00e0 base de cartes \u00e9lectroniques, centr\u00e9e sur le produit final. CR-8000 prend directement en charge la conception de l\u2019architecture, la conception multi-cartes simultan\u00e9e, la co-conception puce\/bo\u00eetier\/carte et la co-conception de la CAO m\u00e9canique enti\u00e8rement en 3D.&nbsp;<\/p>\n<p><b>Valider la connectivit\u00e9 de la cha\u00eene JTAG<\/b><\/p>\n<p>La densit\u00e9 des circuits imprim\u00e9s ne cessant d\u2019augmenter, il devient de plus en plus difficile de pr\u00e9voir des acc\u00e8s aux broches situ\u00e9es sous de nombreux bo\u00eetiers pour les tests lors de la fabrication, notamment pour les bo\u00eetiers \u00e0 matrice de billes (BGA). La technologie JTAG a \u00e9t\u00e9 con\u00e7ue pour offrir un acc\u00e8s de test facile, de sorte qu\u2019une conception JTAG optimis\u00e9e puisse avoir un effet positif sur le retour sur investissement. Une couverture de test JTAG mal optimis\u00e9e au d\u00e9but de la conception peut avoir des cons\u00e9quences sur les co\u00fbts de fabrication et n\u00e9cessiter une modification de la conception de la carte.&nbsp;XJTAG DFT Assistant aidera les ing\u00e9nieurs \u00e0 valider que la connectivit\u00e9 de la cha\u00eene JTAG est correcte, tout en affichant les acc\u00e8s et la couverture du boundary scan sur le sch\u00e9ma \u00e9lectronique gr\u00e2ce \u00e0 son int\u00e9gration compl\u00e8te \u00e0 l\u2019outil CR-8000 Design Gateway.<\/p>\n<p>Simon Payne, le PDG de XJTAG, explique&nbsp;: \u00ab&nbsp;XJTAG est heureux de rejoindre l\u2019\u00e9cosyst\u00e8me de solutions de Zuken. Les entreprises doivent d\u00e9terminer comment maximiser la couverture de test en utilisant le moins de points de test possible au d\u00e9but de la phase de conception. Il est donc essentiel de conna\u00eetre quel acc\u00e8s JTAG est disponible d\u00e8s l\u2019\u00e9tape de sch\u00e9matique. XJTAG DFT Assistant pour CR-8000 Design Gateway de Zuken permettra de voir plus facilement l\u2019acc\u00e8s au test au fil des \u00e9volutions de la conception. Les ing\u00e9nieurs de test peuvent ainsi r\u00e9ellement optimiser le test avant la production des circuits imprim\u00e9s.&nbsp;\u00bb<\/p>\n<p>Bob Potock, vice-pr\u00e9sident du marketing chez Zuken USA, Inc, explique&nbsp;: \u00ab&nbsp;La technologie de boundary scan et DFT Assistant de XJTAG permettront aux ing\u00e9nieurs de construire, optimiser et mesurer la couverture de test de la cha\u00eene au d\u00e9but de l\u2019\u00e9tape de saisie du sch\u00e9ma. Pour nos clients, cette am\u00e9lioration est synonyme d\u2019une meilleure couverture de test qui se traduira par de meilleurs rendements en fabrication et une diminution des co\u00fbts.&nbsp;\u00bb.&nbsp;<\/p>\n<p><a href=\"http:\/\/www.xjtag.com\/\">www.xjtag.com<\/a><\/p>\n<p><a href=\"http:\/\/www.zuken.com\/\">www.zuken.com<\/a><\/p>\n<p><a href=\"http:\/\/www.isit.fr\">www.isit.fr<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Zuken et XJTAG repr\u00e9sent\u00e9s en France par ISIT ont \u00e9tabli un partenariat visant \u00e0 ajouter des capacit\u00e9s de testabilit\u00e9 des conceptions (DFT) \u00e0 la suite CR-8000 de Zuken, afin d\u2019am\u00e9liorer la couverture de test d\u00e8s la saisie du sch\u00e9ma.<\/p>\n","protected":false},"author":9,"featured_media":143995,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[881],"tags":[],"domains":[47],"ppma_author":[1141],"class_list":["post-143994","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-nouveaux-produits","domains-electronique-eci"],"acf":[],"yoast_head":"<title>Zuken annonce le lancement de XJTAG DFT Assistant pour la suite...<\/title>\n<meta name=\"description\" content=\"Zuken et XJTAG repr\u00e9sent\u00e9s en France par ISIT ont \u00e9tabli un partenariat visant \u00e0 ajouter des capacit\u00e9s de testabilit\u00e9 des conceptions (DFT) \u00e0 la suite...\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" 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