{"id":117736,"date":"2018-06-21T22:31:44","date_gmt":"2018-06-21T22:31:44","guid":{"rendered":"https:\/\/\/une-nouvelle-plateforme-de-mesure-usb\/"},"modified":"2018-06-21T22:31:44","modified_gmt":"2018-06-21T22:31:44","slug":"une-nouvelle-plateforme-de-mesure-usb","status":"publish","type":"post","link":"https:\/\/www.ecinews.fr\/fr\/une-nouvelle-plateforme-de-mesure-usb\/","title":{"rendered":"Une nouvelle plateforme de mesure USB"},"content":{"rendered":"<p>\u00ab&nbsp;La plateforme Keysight Streamline Series permet aux entreprises de faire face \u00e0 la pression croissante pour rester productif, optimiser les ressources et respecter des d\u00e9lais serr\u00e9s dans la cr\u00e9ation de nouveaux appareils \u00e9lectroniques. Les clients peuvent d\u00e9sormais progresser en toute confiance \u00e0 chaque \u00e9tape du cycle de vie de leurs produits en s&rsquo;appuyant sur des r\u00e9sultats pr\u00e9cis et reproductibles, quel que soit le facteur de forme dont ils ont besoin : USB compact, modulaire ou de table&nbsp;\u00bb&nbsp;d\u00e9clare&nbsp;Dave Cipriani,&nbsp;Vice-Pr\u00e9sident et Directeur G\u00e9n\u00e9ral de l&rsquo;activit\u00e9 Oscilloscopes de Keysight.<\/p>\n<p>Contr\u00f4l\u00e9s par PC via une connexion USB, les nouveaux instruments de Keysight permettent aux clients de gagner de la place sur le banc d&rsquo;essai et se partagent facilement entre les membres d&rsquo;une \u00e9quipe de d\u00e9veloppement. Gr\u00e2ce \u00e0 leur petite taille, ils sont particuli\u00e8rement adapt\u00e9s pour les activit\u00e9s de test manuel et semi-automatique en validation de conception et en petite production.<\/p>\n<p>La plateforme Keysight Streamline Series est disponible sur trois lignes de mod\u00e8les :<\/p>\n<p>&#8211;&nbsp;Les&nbsp;<a href=\"http:\/\/anws.co\/bvVHx\/%7Bdf8a2aae-6379-47bf-a1dd-3d9148854376%7D%20\/t%20_blank\">mod\u00e8les P937xA<\/a>&nbsp;sont des VNAs compacts \u00e0 deux ports avec une couverture de fr\u00e9quence jusqu&rsquo;\u00e0 26,5 GHz. Tous sont con\u00e7us pour exceller dans les tests de dispositifs passifs tels que les antennes, les filtres et les duplexeurs. Fonctionnant sur un PC h\u00f4te, l&rsquo;interface utilisateur sensible au contexte est identique \u00e0 celle des derniers VNA de table de Keysight.<\/p>\n<p>&#8211; Les&nbsp;<a href=\"http:\/\/anws.co\/bvVHy\/%7Bdf8a2aae-6379-47bf-a1dd-3d9148854376%7D%20\/t%20_blank\">oscilloscopes haute performance P924xA<\/a>&nbsp;offrent une fonctionnalit\u00e9 de mesure compl\u00e8te ainsi qu&rsquo;un d\u00e9clenchement avanc\u00e9, des mises \u00e0 jour rapides des formes d&rsquo;onde et des fonctions populaires telles que le d\u00e9clenchement par zone. Avec l&rsquo;interface Keysight InfiniiVision fonctionnant sur le PC de l&rsquo;utilisateur, l&rsquo;apparence et l\u2019exp\u00e9rience utilisateur sont similaires \u00e0 celles des oscilloscopes de table.<\/p>\n<p>&#8211; En utilisant la g\u00e9n\u00e9ration de forme d&rsquo;onde Trueform exclusive \u00e0 Keysight,&nbsp;<a href=\"http:\/\/anws.co\/bvVHz\/%7Bdf8a2aae-6379-47bf-a1dd-3d9148854376%7D%20\/t%20_blank\">l&rsquo;AWG \u00e0 trois canaux P9336A<\/a>&nbsp;offre une r\u00e9solution de 16 bits avec une bande passante d&rsquo;analyse maximale de 540 MHz et une m\u00e9moire embarqu\u00e9e maximale de 4 Go. Les applications vont de l&rsquo;essai g\u00e9n\u00e9ral \u00e0 la g\u00e9n\u00e9ration de signaux I\/Q complexes pour la caract\u00e9risation des \u00e9metteurs-r\u00e9cepteurs et modulateurs. Pour simplifier la cr\u00e9ation du signal, l&rsquo;USB AWG est compatible avec le logiciel Keysight Signal Studio.<\/p>\n<p><a href=\"http:\/\/anws.co\/bvVHA\/%7Bdf8a2aae-6379-47bf-a1dd-3d9148854376%7D%20\/t%20_blank\">www.keysight.com\/find\/streamline<\/a><\/p>\n<h3 class=\"title\"><a href=\"http:\/\/www.electronique-eci.com\/news\/keysight-technologies-recoit-la-certification-pour-le-logiciel-demulation-de-test-ecall\">Keysight Technologies re\u00e7oit la certification pour le logiciel d&rsquo;\u00e9mulation de test eCall<\/a><\/h3>\n<h3 class=\"title\"><a href=\"http:\/\/www.electronique-eci.com\/news\/solutions-5g-pour-les-fabricants-de-chipsets-et-de-composants\">Solutions 5G pour les fabricants de chipsets et de composants<\/a><\/h3>\n<h3 class=\"title\"><a href=\"http:\/\/www.electronique-eci.com\/news\/ixia-accelere-les-tests-et-reduit-le-temps-de-certification\">Ixia acc\u00e9l\u00e8re les tests et r\u00e9duit le temps de certification<\/a><\/h3>\n","protected":false},"excerpt":{"rendered":"<p>Keysight Technologies, Inc. annonce le lancement de sa nouvelle plateforme de mesure Keysight Streamline Series  compos\u00e9e d&rsquo;instruments USB compacts : des analyseurs de r\u00e9seaux vectoriels (VNA), des oscilloscopes et un g\u00e9n\u00e9rateur de forme d&rsquo;onde arbitraire (AWG) qui exploite les technologies Keysight, les algorithmes de mesure et les logiciels d&rsquo;application.<\/p>\n","protected":false},"author":9,"featured_media":117737,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[],"tags":[],"domains":[47],"ppma_author":[1141],"class_list":["post-117736","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","domains-electronique-eci"],"acf":[],"yoast_head":"<title>Une nouvelle plateforme de mesure USB ...<\/title>\n<meta name=\"description\" content=\"Keysight Technologies, Inc. annonce le lancement de sa nouvelle plateforme de mesure Keysight Streamline Series  compos\u00e9e d&#039;instruments USB compacts : des...\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts\/117736\/\" \/>\n<meta property=\"og:locale\" content=\"fr_FR\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Une nouvelle plateforme de mesure USB\" \/>\n<meta property=\"og:description\" content=\"Keysight Technologies, Inc. annonce le lancement de sa nouvelle plateforme de mesure Keysight Streamline Series compos\u00e9e d&#039;instruments USB compacts : des analyseurs de r\u00e9seaux vectoriels (VNA), des oscilloscopes et un g\u00e9n\u00e9rateur de forme d&#039;onde arbitraire (AWG) qui exploite les technologies Keysight, les algorithmes de mesure et les logiciels d&#039;application.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts\/117736\/\" \/>\n<meta property=\"og:site_name\" content=\"EENewsEurope\" \/>\n<meta property=\"article:published_time\" content=\"2018-06-21T22:31:44+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/www.ecinews.fr\/wp-content\/uploads\/import\/default\/files\/sites\/default\/files\/images\/eci6432_keysight-scaled.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"2560\" \/>\n\t<meta property=\"og:image:height\" content=\"1943\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"author\" content=\"Alain Dieul\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"Alain Dieul\" \/>\n\t<meta name=\"twitter:label2\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"2 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\/\/www.ecinews.fr\/fr\/une-nouvelle-plateforme-de-mesure-usb\/#article\",\"isPartOf\":{\"@id\":\"https:\/\/www.ecinews.fr\/fr\/une-nouvelle-plateforme-de-mesure-usb\/\"},\"author\":{\"name\":\"Alain Dieul\",\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#\/schema\/person\/568c789a4794bd460460501ba91f5daf\"},\"headline\":\"Une nouvelle plateforme de mesure USB\",\"datePublished\":\"2018-06-21T22:31:44+00:00\",\"dateModified\":\"2018-06-21T22:31:44+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\/\/www.ecinews.fr\/fr\/une-nouvelle-plateforme-de-mesure-usb\/\"},\"wordCount\":456,\"publisher\":{\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#organization\"},\"inLanguage\":\"fr-FR\"},{\"@type\":\"WebPage\",\"@id\":\"https:\/\/www.ecinews.fr\/fr\/une-nouvelle-plateforme-de-mesure-usb\/\",\"url\":\"https:\/\/www.ecinews.fr\/fr\/une-nouvelle-plateforme-de-mesure-usb\/\",\"name\":\"Une nouvelle plateforme de mesure USB -\",\"isPartOf\":{\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#website\"},\"datePublished\":\"2018-06-21T22:31:44+00:00\",\"dateModified\":\"2018-06-21T22:31:44+00:00\",\"breadcrumb\":{\"@id\":\"https:\/\/www.ecinews.fr\/fr\/une-nouvelle-plateforme-de-mesure-usb\/#breadcrumb\"},\"inLanguage\":\"fr-FR\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\/\/www.ecinews.fr\/fr\/une-nouvelle-plateforme-de-mesure-usb\/\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\/\/www.ecinews.fr\/fr\/une-nouvelle-plateforme-de-mesure-usb\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\/\/www.ecinews.fr\/fr\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Une nouvelle plateforme de mesure USB\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#website\",\"url\":\"https:\/\/www.eenewseurope.com\/en\/\",\"name\":\"EENewsEurope\",\"description\":\"Just another WordPress site\",\"publisher\":{\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\/\/www.eenewseurope.com\/en\/?s={search_term_string}\"},\"query-input\":\"required name=search_term_string\"}],\"inLanguage\":\"fr-FR\"},{\"@type\":\"Organization\",\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#organization\",\"name\":\"EENewsEurope\",\"url\":\"https:\/\/www.eenewseurope.com\/en\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"fr-FR\",\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#\/schema\/logo\/image\/\",\"url\":\"https:\/\/www.ecinews.fr\/wp-content\/uploads\/2022\/02\/logo-1.jpg\",\"contentUrl\":\"https:\/\/www.ecinews.fr\/wp-content\/uploads\/2022\/02\/logo-1.jpg\",\"width\":283,\"height\":113,\"caption\":\"EENewsEurope\"},\"image\":{\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#\/schema\/logo\/image\/\"}},{\"@type\":\"Person\",\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#\/schema\/person\/568c789a4794bd460460501ba91f5daf\",\"name\":\"Alain Dieul\",\"image\":{\"@type\":\"ImageObject\",\"inLanguage\":\"fr-FR\",\"@id\":\"https:\/\/www.eenewseurope.com\/en\/#\/schema\/person\/image\/6d32dc651fbcef3b338066625b118364\",\"url\":\"https:\/\/secure.gravatar.com\/avatar\/93708ec89b35deb10f4cfbfe144b4e07?s=96&d=mm&r=g\",\"contentUrl\":\"https:\/\/secure.gravatar.com\/avatar\/93708ec89b35deb10f4cfbfe144b4e07?s=96&d=mm&r=g\",\"caption\":\"Alain Dieul\"}}]}<\/script>","yoast_head_json":{"title":"Une nouvelle plateforme de mesure USB ...","description":"Keysight Technologies, Inc. annonce le lancement de sa nouvelle plateforme de mesure Keysight Streamline Series  compos\u00e9e d'instruments USB compacts : des...","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts\/117736\/","og_locale":"fr_FR","og_type":"article","og_title":"Une nouvelle plateforme de mesure USB","og_description":"Keysight Technologies, Inc. annonce le lancement de sa nouvelle plateforme de mesure Keysight Streamline Series compos\u00e9e d'instruments USB compacts : des analyseurs de r\u00e9seaux vectoriels (VNA), des oscilloscopes et un g\u00e9n\u00e9rateur de forme d'onde arbitraire (AWG) qui exploite les technologies Keysight, les algorithmes de mesure et les logiciels d'application.","og_url":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts\/117736\/","og_site_name":"EENewsEurope","article_published_time":"2018-06-21T22:31:44+00:00","og_image":[{"width":2560,"height":1943,"url":"https:\/\/www.ecinews.fr\/wp-content\/uploads\/import\/default\/files\/sites\/default\/files\/images\/eci6432_keysight-scaled.jpg","type":"image\/jpeg"}],"author":"Alain Dieul","twitter_card":"summary_large_image","twitter_misc":{"Written by":"Alain Dieul","Est. reading time":"2 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/www.ecinews.fr\/fr\/une-nouvelle-plateforme-de-mesure-usb\/#article","isPartOf":{"@id":"https:\/\/www.ecinews.fr\/fr\/une-nouvelle-plateforme-de-mesure-usb\/"},"author":{"name":"Alain Dieul","@id":"https:\/\/www.eenewseurope.com\/en\/#\/schema\/person\/568c789a4794bd460460501ba91f5daf"},"headline":"Une nouvelle plateforme de mesure USB","datePublished":"2018-06-21T22:31:44+00:00","dateModified":"2018-06-21T22:31:44+00:00","mainEntityOfPage":{"@id":"https:\/\/www.ecinews.fr\/fr\/une-nouvelle-plateforme-de-mesure-usb\/"},"wordCount":456,"publisher":{"@id":"https:\/\/www.eenewseurope.com\/en\/#organization"},"inLanguage":"fr-FR"},{"@type":"WebPage","@id":"https:\/\/www.ecinews.fr\/fr\/une-nouvelle-plateforme-de-mesure-usb\/","url":"https:\/\/www.ecinews.fr\/fr\/une-nouvelle-plateforme-de-mesure-usb\/","name":"Une nouvelle plateforme de mesure USB -","isPartOf":{"@id":"https:\/\/www.eenewseurope.com\/en\/#website"},"datePublished":"2018-06-21T22:31:44+00:00","dateModified":"2018-06-21T22:31:44+00:00","breadcrumb":{"@id":"https:\/\/www.ecinews.fr\/fr\/une-nouvelle-plateforme-de-mesure-usb\/#breadcrumb"},"inLanguage":"fr-FR","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.ecinews.fr\/fr\/une-nouvelle-plateforme-de-mesure-usb\/"]}]},{"@type":"BreadcrumbList","@id":"https:\/\/www.ecinews.fr\/fr\/une-nouvelle-plateforme-de-mesure-usb\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/www.ecinews.fr\/fr\/"},{"@type":"ListItem","position":2,"name":"Une nouvelle plateforme de mesure USB"}]},{"@type":"WebSite","@id":"https:\/\/www.eenewseurope.com\/en\/#website","url":"https:\/\/www.eenewseurope.com\/en\/","name":"EENewsEurope","description":"Just another WordPress site","publisher":{"@id":"https:\/\/www.eenewseurope.com\/en\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.eenewseurope.com\/en\/?s={search_term_string}"},"query-input":"required name=search_term_string"}],"inLanguage":"fr-FR"},{"@type":"Organization","@id":"https:\/\/www.eenewseurope.com\/en\/#organization","name":"EENewsEurope","url":"https:\/\/www.eenewseurope.com\/en\/","logo":{"@type":"ImageObject","inLanguage":"fr-FR","@id":"https:\/\/www.eenewseurope.com\/en\/#\/schema\/logo\/image\/","url":"https:\/\/www.ecinews.fr\/wp-content\/uploads\/2022\/02\/logo-1.jpg","contentUrl":"https:\/\/www.ecinews.fr\/wp-content\/uploads\/2022\/02\/logo-1.jpg","width":283,"height":113,"caption":"EENewsEurope"},"image":{"@id":"https:\/\/www.eenewseurope.com\/en\/#\/schema\/logo\/image\/"}},{"@type":"Person","@id":"https:\/\/www.eenewseurope.com\/en\/#\/schema\/person\/568c789a4794bd460460501ba91f5daf","name":"Alain Dieul","image":{"@type":"ImageObject","inLanguage":"fr-FR","@id":"https:\/\/www.eenewseurope.com\/en\/#\/schema\/person\/image\/6d32dc651fbcef3b338066625b118364","url":"https:\/\/secure.gravatar.com\/avatar\/93708ec89b35deb10f4cfbfe144b4e07?s=96&d=mm&r=g","contentUrl":"https:\/\/secure.gravatar.com\/avatar\/93708ec89b35deb10f4cfbfe144b4e07?s=96&d=mm&r=g","caption":"Alain Dieul"}}]}},"authors":[{"term_id":1141,"user_id":9,"is_guest":0,"slug":"alaindieul","display_name":"Alain Dieul","avatar_url":"https:\/\/secure.gravatar.com\/avatar\/93708ec89b35deb10f4cfbfe144b4e07?s=96&d=mm&r=g","0":null,"1":"","2":"","3":"","4":"","5":"","6":"","7":"","8":""}],"_links":{"self":[{"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts\/117736"}],"collection":[{"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/users\/9"}],"replies":[{"embeddable":true,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/comments?post=117736"}],"version-history":[{"count":0,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/posts\/117736\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/media\/117737"}],"wp:attachment":[{"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/media?parent=117736"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/categories?post=117736"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/tags?post=117736"},{"taxonomy":"domains","embeddable":true,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/domains?post=117736"},{"taxonomy":"author","embeddable":true,"href":"https:\/\/www.ecinews.fr\/fr\/wp-json\/wp\/v2\/ppma_author?post=117736"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}