{"version":"1.0","provider_name":"EENewsEurope","provider_url":"https:\/\/www.ecinews.fr\/fr\/","author_name":"eeNews Europe","author_url":"https:\/\/www.ecinews.fr\/fr\/author\/eenews-europe\/","title":"Testeurs \u00e0 sondes mobiles pour circuits imprim\u00e9s nus","type":"rich","width":600,"height":338,"html":"<blockquote class=\"wp-embedded-content\" data-secret=\"nuV7Npv1gq\"><a href=\"https:\/\/www.ecinews.fr\/fr\/testeurs-a-sondes-mobiles-pour-circuits-imprimes-nus\/\">Testeurs \u00e0 sondes mobiles pour circuits imprim\u00e9s nus<\/a><\/blockquote><iframe sandbox=\"allow-scripts\" security=\"restricted\" src=\"https:\/\/www.ecinews.fr\/fr\/testeurs-a-sondes-mobiles-pour-circuits-imprimes-nus\/embed\/#?secret=nuV7Npv1gq\" width=\"600\" height=\"338\" title=\"\u00ab\u00a0Testeurs \u00e0 sondes mobiles pour circuits imprim\u00e9s nus\u00a0\u00bb &#8212; EENewsEurope\" data-secret=\"nuV7Npv1gq\" frameborder=\"0\" marginwidth=\"0\" marginheight=\"0\" scrolling=\"no\" class=\"wp-embedded-content\"><\/iframe><script type=\"text\/javascript\">\n\/* <![CDATA[ *\/\n\/*! This file is auto-generated *\/\n!function(d,l){\"use strict\";l.querySelector&&d.addEventListener&&\"undefined\"!=typeof URL&&(d.wp=d.wp||{},d.wp.receiveEmbedMessage||(d.wp.receiveEmbedMessage=function(e){var t=e.data;if((t||t.secret||t.message||t.value)&&!\/[^a-zA-Z0-9]\/.test(t.secret)){for(var s,r,n,a=l.querySelectorAll('iframe[data-secret=\"'+t.secret+'\"]'),o=l.querySelectorAll('blockquote[data-secret=\"'+t.secret+'\"]'),c=new RegExp(\"^https?:$\",\"i\"),i=0;i<o.length;i++)o[i].style.display=\"none\";for(i=0;i<a.length;i++)s=a[i],e.source===s.contentWindow&&(s.removeAttribute(\"style\"),\"height\"===t.message?(1e3<(r=parseInt(t.value,10))?r=1e3:~~r<200&&(r=200),s.height=r):\"link\"===t.message&&(r=new URL(s.getAttribute(\"src\")),n=new URL(t.value),c.test(n.protocol))&&n.host===r.host&&l.activeElement===s&&(d.top.location.href=t.value))}},d.addEventListener(\"message\",d.wp.receiveEmbedMessage,!1),l.addEventListener(\"DOMContentLoaded\",function(){for(var e,t,s=l.querySelectorAll(\"iframe.wp-embedded-content\"),r=0;r<s.length;r++)(t=(e=s[r]).getAttribute(\"data-secret\"))||(t=Math.random().toString(36).substring(2,12),e.src+=\"#?secret=\"+t,e.setAttribute(\"data-secret\",t)),e.contentWindow.postMessage({message:\"ready\",secret:t},\"*\")},!1)))}(window,document);\n\/* ]]> *\/\n<\/script>\n","thumbnail_url":"https:\/\/www.ecinews.fr\/wp-content\/uploads\/import\/default\/files\/import\/eci6382_seica_rapid270-loader_lo-scaled.jpg","thumbnail_width":2560,"thumbnail_height":1747,"description":"D\u00e9di\u00e9e pour le test \u00e9lectrique de circuits imprim\u00e9s nus (PCB), la gamme de testeurs Rapid de Seica utilise une technologie dite Ultra Fast, et une ergonomie am\u00e9lior\u00e9e. Cette technologie est bas\u00e9e sur un stimuli et syst\u00e8me de mesure innovant qui est directement install\u00e9 sur les sondes mobiles, donc tr\u00e8s proche du circuit sous test. De ce fait, chaque test dispose d'un mat\u00e9riel intelligent bas\u00e9 sur la technologie DSP (Digital Signal Processor) capable de communiquer en temps r\u00e9el et de faire des mesures capacitives, r\u00e9sistives et inductives d\u2019une grande pr\u00e9cision."}