{"version":"1.0","provider_name":"EENewsEurope","provider_url":"https:\/\/www.ecinews.fr\/fr\/","author_name":"Alain Dieul","author_url":"https:\/\/www.ecinews.fr\/fr\/author\/alaindieul\/","title":"Tektronix acc\u00e9l\u00e8re les tests de conformit\u00e9 IEM\/CEM","type":"rich","width":600,"height":338,"html":"<blockquote class=\"wp-embedded-content\" data-secret=\"M0XTP70rel\"><a href=\"https:\/\/www.ecinews.fr\/fr\/tektronix-accelere-les-tests-de-conformite-iem-cem\/\">Tektronix acc\u00e9l\u00e8re les tests de conformit\u00e9 IEM\/CEM<\/a><\/blockquote><iframe sandbox=\"allow-scripts\" security=\"restricted\" src=\"https:\/\/www.ecinews.fr\/fr\/tektronix-accelere-les-tests-de-conformite-iem-cem\/embed\/#?secret=M0XTP70rel\" width=\"600\" height=\"338\" title=\"\u00ab\u00a0Tektronix acc\u00e9l\u00e8re les tests de conformit\u00e9 IEM\/CEM\u00a0\u00bb &#8212; EENewsEurope\" data-secret=\"M0XTP70rel\" frameborder=\"0\" marginwidth=\"0\" marginheight=\"0\" scrolling=\"no\" class=\"wp-embedded-content\"><\/iframe><script type=\"text\/javascript\">\n\/* <![CDATA[ *\/\n\/*! This file is auto-generated *\/\n!function(d,l){\"use strict\";l.querySelector&&d.addEventListener&&\"undefined\"!=typeof URL&&(d.wp=d.wp||{},d.wp.receiveEmbedMessage||(d.wp.receiveEmbedMessage=function(e){var t=e.data;if((t||t.secret||t.message||t.value)&&!\/[^a-zA-Z0-9]\/.test(t.secret)){for(var s,r,n,a=l.querySelectorAll('iframe[data-secret=\"'+t.secret+'\"]'),o=l.querySelectorAll('blockquote[data-secret=\"'+t.secret+'\"]'),c=new RegExp(\"^https?:$\",\"i\"),i=0;i<o.length;i++)o[i].style.display=\"none\";for(i=0;i<a.length;i++)s=a[i],e.source===s.contentWindow&&(s.removeAttribute(\"style\"),\"height\"===t.message?(1e3<(r=parseInt(t.value,10))?r=1e3:~~r<200&&(r=200),s.height=r):\"link\"===t.message&&(r=new URL(s.getAttribute(\"src\")),n=new URL(t.value),c.test(n.protocol))&&n.host===r.host&&l.activeElement===s&&(d.top.location.href=t.value))}},d.addEventListener(\"message\",d.wp.receiveEmbedMessage,!1),l.addEventListener(\"DOMContentLoaded\",function(){for(var e,t,s=l.querySelectorAll(\"iframe.wp-embedded-content\"),r=0;r<s.length;r++)(t=(e=s[r]).getAttribute(\"data-secret\"))||(t=Math.random().toString(36).substring(2,12),e.src+=\"#?secret=\"+t,e.setAttribute(\"data-secret\",t)),e.contentWindow.postMessage({message:\"ready\",secret:t},\"*\")},!1)))}(window,document);\n\/* ]]> *\/\n<\/script>\n","thumbnail_url":"https:\/\/www.ecinews.fr\/wp-content\/uploads\/import\/default\/files\/sites\/default\/files\/images\/eci6175_tektronix.jpg","thumbnail_width":1366,"thumbnail_height":768,"description":"D\u2019apr\u00e8s le livre blanc Intertek \u00ab\u00a0Pourquoi 50% des produits \u00e9chouent aux premiers tests CEM\u00a0\u00bb, environ 50% des produits ne r\u00e9pondraient pas aux tests de compatibilit\u00e9 \u00e9lectromagn\u00e9tique dans l'environnement de conception \u00e9lectronique d'aujourd'hui. C\u2019est pourquoi la solution EMCVu propos\u00e9e par Tektronix offre aux ing\u00e9nieurs une approche pr\u00e9cise, pratique et rentable pour d\u00e9terminer si leurs conceptions de produits passeront les tests de conformit\u00e9 en mati\u00e8re d'\u00e9missions CEM avec succ\u00e8s d\u00e8s le premier essai."}