{"version":"1.0","provider_name":"EENewsEurope","provider_url":"https:\/\/www.ecinews.fr\/fr\/","author_name":"eeNews Europe","author_url":"https:\/\/www.ecinews.fr\/fr\/author\/eenews-europe\/","title":"Solution \u00e9conomique pour les tests \u00e0 faible tension","type":"rich","width":600,"height":338,"html":"<blockquote class=\"wp-embedded-content\" data-secret=\"bsCDips9am\"><a href=\"https:\/\/www.ecinews.fr\/fr\/solution-economique-pour-les-tests-a-faible-tension\/\">Solution \u00e9conomique pour les tests \u00e0 faible tension<\/a><\/blockquote><iframe sandbox=\"allow-scripts\" security=\"restricted\" src=\"https:\/\/www.ecinews.fr\/fr\/solution-economique-pour-les-tests-a-faible-tension\/embed\/#?secret=bsCDips9am\" width=\"600\" height=\"338\" title=\"\u00ab\u00a0Solution \u00e9conomique pour les tests \u00e0 faible tension\u00a0\u00bb &#8212; EENewsEurope\" data-secret=\"bsCDips9am\" frameborder=\"0\" marginwidth=\"0\" marginheight=\"0\" scrolling=\"no\" class=\"wp-embedded-content\"><\/iframe><script type=\"text\/javascript\">\n\/* <![CDATA[ *\/\n\/*! This file is auto-generated *\/\n!function(d,l){\"use strict\";l.querySelector&&d.addEventListener&&\"undefined\"!=typeof URL&&(d.wp=d.wp||{},d.wp.receiveEmbedMessage||(d.wp.receiveEmbedMessage=function(e){var t=e.data;if((t||t.secret||t.message||t.value)&&!\/[^a-zA-Z0-9]\/.test(t.secret)){for(var s,r,n,a=l.querySelectorAll('iframe[data-secret=\"'+t.secret+'\"]'),o=l.querySelectorAll('blockquote[data-secret=\"'+t.secret+'\"]'),c=new RegExp(\"^https?:$\",\"i\"),i=0;i<o.length;i++)o[i].style.display=\"none\";for(i=0;i<a.length;i++)s=a[i],e.source===s.contentWindow&&(s.removeAttribute(\"style\"),\"height\"===t.message?(1e3<(r=parseInt(t.value,10))?r=1e3:~~r<200&&(r=200),s.height=r):\"link\"===t.message&&(r=new URL(s.getAttribute(\"src\")),n=new URL(t.value),c.test(n.protocol))&&n.host===r.host&&l.activeElement===s&&(d.top.location.href=t.value))}},d.addEventListener(\"message\",d.wp.receiveEmbedMessage,!1),l.addEventListener(\"DOMContentLoaded\",function(){for(var e,t,s=l.querySelectorAll(\"iframe.wp-embedded-content\"),r=0;r<s.length;r++)(t=(e=s[r]).getAttribute(\"data-secret\"))||(t=Math.random().toString(36).substring(2,12),e.src+=\"#?secret=\"+t,e.setAttribute(\"data-secret\",t)),e.contentWindow.postMessage({message:\"ready\",secret:t},\"*\")},!1)))}(window,document);\n\/* ]]> *\/\n<\/script>\n","thumbnail_url":"https:\/\/www.ecinews.fr\/wp-content\/uploads\/import\/default\/files\/import\/eci2931_keithley.jpg","thumbnail_width":2400,"thumbnail_height":2400,"description":"Keithley Instruments annonce l'arriv\u00e9e d'un nouvel mod\u00e8le qui vient s'ajouter \u00e0 la famille des SourceMeters, s\u00e9rie 2400. Comme toutes les unit\u00e9s de source et mesure de Keithley, le nouveau mod\u00e8le 2401 a \u00e9t\u00e9 pr\u00e9vu pour des applications de test qui demandent une grande pr\u00e9cision, par exemple, la caract\u00e9risation I-V des cellules photovolta\u00efques, des LED \u00e0 haute luminosit\u00e9, des mat\u00e9riaux basse tension et des composants semi-conducteurs ainsi que les mesures de r\u00e9sistances."}