{"version":"1.0","provider_name":"EENewsEurope","provider_url":"https:\/\/www.ecinews.fr\/fr\/","author_name":"eeNews Europe","author_url":"https:\/\/www.ecinews.fr\/fr\/author\/eenews-europe\/","title":"Solution automatis\u00e9e pour le test optique 100G","type":"rich","width":600,"height":338,"html":"<blockquote class=\"wp-embedded-content\" data-secret=\"Pds4wsqWpj\"><a href=\"https:\/\/www.ecinews.fr\/fr\/solution-automatisee-pour-le-test-optique-100g\/\">Solution automatis\u00e9e pour le test optique 100G<\/a><\/blockquote><iframe sandbox=\"allow-scripts\" security=\"restricted\" src=\"https:\/\/www.ecinews.fr\/fr\/solution-automatisee-pour-le-test-optique-100g\/embed\/#?secret=Pds4wsqWpj\" width=\"600\" height=\"338\" title=\"\u00ab\u00a0Solution automatis\u00e9e pour le test optique 100G\u00a0\u00bb &#8212; EENewsEurope\" data-secret=\"Pds4wsqWpj\" frameborder=\"0\" marginwidth=\"0\" marginheight=\"0\" scrolling=\"no\" class=\"wp-embedded-content\"><\/iframe><script type=\"text\/javascript\">\n\/* <![CDATA[ *\/\n\/*! This file is auto-generated *\/\n!function(d,l){\"use strict\";l.querySelector&&d.addEventListener&&\"undefined\"!=typeof URL&&(d.wp=d.wp||{},d.wp.receiveEmbedMessage||(d.wp.receiveEmbedMessage=function(e){var t=e.data;if((t||t.secret||t.message||t.value)&&!\/[^a-zA-Z0-9]\/.test(t.secret)){for(var s,r,n,a=l.querySelectorAll('iframe[data-secret=\"'+t.secret+'\"]'),o=l.querySelectorAll('blockquote[data-secret=\"'+t.secret+'\"]'),c=new RegExp(\"^https?:$\",\"i\"),i=0;i<o.length;i++)o[i].style.display=\"none\";for(i=0;i<a.length;i++)s=a[i],e.source===s.contentWindow&&(s.removeAttribute(\"style\"),\"height\"===t.message?(1e3<(r=parseInt(t.value,10))?r=1e3:~~r<200&&(r=200),s.height=r):\"link\"===t.message&&(r=new URL(s.getAttribute(\"src\")),n=new URL(t.value),c.test(n.protocol))&&n.host===r.host&&l.activeElement===s&&(d.top.location.href=t.value))}},d.addEventListener(\"message\",d.wp.receiveEmbedMessage,!1),l.addEventListener(\"DOMContentLoaded\",function(){for(var e,t,s=l.querySelectorAll(\"iframe.wp-embedded-content\"),r=0;r<s.length;r++)(t=(e=s[r]).getAttribute(\"data-secret\"))||(t=Math.random().toString(36).substring(2,12),e.src+=\"#?secret=\"+t,e.setAttribute(\"data-secret\",t)),e.contentWindow.postMessage({message:\"ready\",secret:t},\"*\")},!1)))}(window,document);\n\/* ]]> *\/\n<\/script>\n","thumbnail_url":"https:\/\/cdn.eenewseurope.com\/wp-content\/uploads\/import\/default\/files\/import\/eci7425_tektronix_tekexpress_100gbase-sr4_test_report.jpg","thumbnail_width":737,"thumbnail_height":574,"description":"La publication de la sp\u00e9cification IEEE 802.3bm favorise l'acceptation par le march\u00e9 de produits optiques 100G \u00e0 moindres co\u00fbts. Tektronix r\u00e9agit en lan\u00e7ant une solution enti\u00e8rement automatis\u00e9e assurant la mesure de la modulation TDEC et le test de la conformit\u00e9 100GBASE-SR4. Elle rend plus rapide et ais\u00e9 le processus complexe visant \u00e0 garantir que de nouveaux concepts de produits respectent cette sp\u00e9cification optique."}