{"version":"1.0","provider_name":"EENewsEurope","provider_url":"https:\/\/www.ecinews.fr\/fr\/","author_name":"eeNews Europe","author_url":"https:\/\/www.ecinews.fr\/fr\/author\/eenews-europe\/","title":"Premi\u00e8re tranche de silicium test\u00e9e sans contact","type":"rich","width":600,"height":338,"html":"<blockquote class=\"wp-embedded-content\" data-secret=\"W0WymV4t5l\"><a href=\"https:\/\/www.ecinews.fr\/fr\/premiere-tranche-de-silicium-testee-sans-contact\/\">Premi\u00e8re tranche de silicium test\u00e9e sans contact<\/a><\/blockquote><iframe sandbox=\"allow-scripts\" security=\"restricted\" src=\"https:\/\/www.ecinews.fr\/fr\/premiere-tranche-de-silicium-testee-sans-contact\/embed\/#?secret=W0WymV4t5l\" width=\"600\" height=\"338\" title=\"\u00ab\u00a0Premi\u00e8re tranche de silicium test\u00e9e sans contact\u00a0\u00bb &#8212; EENewsEurope\" data-secret=\"W0WymV4t5l\" frameborder=\"0\" marginwidth=\"0\" marginheight=\"0\" scrolling=\"no\" class=\"wp-embedded-content\"><\/iframe><script type=\"text\/javascript\">\n\/* <![CDATA[ *\/\n\/*! This file is auto-generated *\/\n!function(d,l){\"use strict\";l.querySelector&&d.addEventListener&&\"undefined\"!=typeof URL&&(d.wp=d.wp||{},d.wp.receiveEmbedMessage||(d.wp.receiveEmbedMessage=function(e){var t=e.data;if((t||t.secret||t.message||t.value)&&!\/[^a-zA-Z0-9]\/.test(t.secret)){for(var s,r,n,a=l.querySelectorAll('iframe[data-secret=\"'+t.secret+'\"]'),o=l.querySelectorAll('blockquote[data-secret=\"'+t.secret+'\"]'),c=new RegExp(\"^https?:$\",\"i\"),i=0;i<o.length;i++)o[i].style.display=\"none\";for(i=0;i<a.length;i++)s=a[i],e.source===s.contentWindow&&(s.removeAttribute(\"style\"),\"height\"===t.message?(1e3<(r=parseInt(t.value,10))?r=1e3:~~r<200&&(r=200),s.height=r):\"link\"===t.message&&(r=new URL(s.getAttribute(\"src\")),n=new URL(t.value),c.test(n.protocol))&&n.host===r.host&&l.activeElement===s&&(d.top.location.href=t.value))}},d.addEventListener(\"message\",d.wp.receiveEmbedMessage,!1),l.addEventListener(\"DOMContentLoaded\",function(){for(var e,t,s=l.querySelectorAll(\"iframe.wp-embedded-content\"),r=0;r<s.length;r++)(t=(e=s[r]).getAttribute(\"data-secret\"))||(t=Math.random().toString(36).substring(2,12),e.src+=\"#?secret=\"+t,e.setAttribute(\"data-secret\",t)),e.contentWindow.postMessage({message:\"ready\",secret:t},\"*\")},!1)))}(window,document);\n\/* ]]> *\/\n<\/script>\n","thumbnail_url":"https:\/\/www.ecinews.fr\/wp-content\/uploads\/import\/default\/files\/import\/eci3085_stm.jpg","thumbnail_width":1500,"thumbnail_height":1050,"description":"STMicroelectronics est le premier fabricant de semiconducteurs au monde \u00e0 annoncer avoir r\u00e9alis\u00e9 une tranche de silicium dont les puces ont \u00e9t\u00e9 enti\u00e8rement test\u00e9es sans utiliser de sondes \u00e0 contact. Les innovations r\u00e9alis\u00e9es dans les technologies de test permettent de contr\u00f4ler des tranches contenant des puces telles que des circuits int\u00e9gr\u00e9s d'identification par radiofr\u00e9quences (RFID) en utilisant des ondes \u00e9lectromagn\u00e9tiques comme lien unique avec les circuits situ\u00e9s sur la tranche."}