{"version":"1.0","provider_name":"EENewsEurope","provider_url":"https:\/\/www.ecinews.fr\/fr\/","author_name":"eeNews Europe","author_url":"https:\/\/www.ecinews.fr\/fr\/author\/eenews-europe\/","title":"Nouvelle m\u00e9thode de test pour condensateurs au tantale","type":"rich","width":600,"height":338,"html":"<blockquote class=\"wp-embedded-content\" data-secret=\"z93rf5t7Zz\"><a href=\"https:\/\/www.ecinews.fr\/fr\/nouvelle-methode-de-test-pour-condensateurs-au-tantale\/\">Nouvelle m\u00e9thode de test pour condensateurs au tantale<\/a><\/blockquote><iframe sandbox=\"allow-scripts\" security=\"restricted\" src=\"https:\/\/www.ecinews.fr\/fr\/nouvelle-methode-de-test-pour-condensateurs-au-tantale\/embed\/#?secret=z93rf5t7Zz\" width=\"600\" height=\"338\" title=\"\u00ab\u00a0Nouvelle m\u00e9thode de test pour condensateurs au tantale\u00a0\u00bb &#8212; EENewsEurope\" data-secret=\"z93rf5t7Zz\" frameborder=\"0\" marginwidth=\"0\" marginheight=\"0\" scrolling=\"no\" class=\"wp-embedded-content\"><\/iframe><script type=\"text\/javascript\">\n\/* <![CDATA[ *\/\n\/*! This file is auto-generated *\/\n!function(d,l){\"use strict\";l.querySelector&&d.addEventListener&&\"undefined\"!=typeof URL&&(d.wp=d.wp||{},d.wp.receiveEmbedMessage||(d.wp.receiveEmbedMessage=function(e){var t=e.data;if((t||t.secret||t.message||t.value)&&!\/[^a-zA-Z0-9]\/.test(t.secret)){for(var s,r,n,a=l.querySelectorAll('iframe[data-secret=\"'+t.secret+'\"]'),o=l.querySelectorAll('blockquote[data-secret=\"'+t.secret+'\"]'),c=new RegExp(\"^https?:$\",\"i\"),i=0;i<o.length;i++)o[i].style.display=\"none\";for(i=0;i<a.length;i++)s=a[i],e.source===s.contentWindow&&(s.removeAttribute(\"style\"),\"height\"===t.message?(1e3<(r=parseInt(t.value,10))?r=1e3:~~r<200&&(r=200),s.height=r):\"link\"===t.message&&(r=new URL(s.getAttribute(\"src\")),n=new URL(t.value),c.test(n.protocol))&&n.host===r.host&&l.activeElement===s&&(d.top.location.href=t.value))}},d.addEventListener(\"message\",d.wp.receiveEmbedMessage,!1),l.addEventListener(\"DOMContentLoaded\",function(){for(var e,t,s=l.querySelectorAll(\"iframe.wp-embedded-content\"),r=0;r<s.length;r++)(t=(e=s[r]).getAttribute(\"data-secret\"))||(t=Math.random().toString(36).substring(2,12),e.src+=\"#?secret=\"+t,e.setAttribute(\"data-secret\",t)),e.contentWindow.postMessage({message:\"ready\",secret:t},\"*\")},!1)))}(window,document);\n\/* ]]> *\/\n<\/script>\n","thumbnail_url":"https:\/\/www.ecinews.fr\/wp-content\/uploads\/import\/default\/files\/import\/eci3833_avx_avv716-q-process-scaled.jpg","thumbnail_width":2560,"thumbnail_height":2126,"description":"AVX Corporation a d\u00e9velopp\u00e9 une m\u00e9thode de qualification novatrice efficace pour la fabrication et test de condensateurs tantale haute fiabilit\u00e9. Initialement pr\u00e9sent\u00e9e \u00e0 des acteurs influents des industries militaires et a\u00e9rospatiales au Tantalum Hi-Rel Symposium \u00e0 Biddeford, Maine, en janvier dernier, la m\u00e9thode Q-Process a aussi \u00e9t\u00e9 d\u00e9crite dans une communication \u00e0 la conf\u00e9rence internationale CARTS (Capacitor and Resistor Technical Symposium) \u00e0 Houston, Texas, le 26 mars dernier. Bien re\u00e7ue par les participants aux deux \u00e9v\u00e9nements, elle est pr\u00eate \u00e0 remplacer la qualification Weibull comme standard industriel d'\u00e9valuation de la fiabilit\u00e9 des condensateurs au tantale."}