{"version":"1.0","provider_name":"EENewsEurope","provider_url":"https:\/\/www.ecinews.fr\/fr\/","author_name":"eeNews Europe","author_url":"https:\/\/www.ecinews.fr\/fr\/author\/eenews-europe\/","title":"Logiciel gratuit d'autotest MCU certifi\u00e9 VDE","type":"rich","width":600,"height":338,"html":"<blockquote class=\"wp-embedded-content\" data-secret=\"X19eEZJRMJ\"><a href=\"https:\/\/www.ecinews.fr\/fr\/logiciel-gratuit-dautotest-mcu-certifie-vde\/\">Logiciel gratuit d&rsquo;autotest MCU certifi\u00e9 VDE<\/a><\/blockquote><iframe sandbox=\"allow-scripts\" security=\"restricted\" src=\"https:\/\/www.ecinews.fr\/fr\/logiciel-gratuit-dautotest-mcu-certifie-vde\/embed\/#?secret=X19eEZJRMJ\" width=\"600\" height=\"338\" title=\"\u00ab\u00a0Logiciel gratuit d&rsquo;autotest MCU certifi\u00e9 VDE\u00a0\u00bb &#8212; EENewsEurope\" data-secret=\"X19eEZJRMJ\" frameborder=\"0\" marginwidth=\"0\" marginheight=\"0\" scrolling=\"no\" class=\"wp-embedded-content\"><\/iframe><script type=\"text\/javascript\">\n\/* <![CDATA[ *\/\n\/*! This file is auto-generated *\/\n!function(d,l){\"use strict\";l.querySelector&&d.addEventListener&&\"undefined\"!=typeof URL&&(d.wp=d.wp||{},d.wp.receiveEmbedMessage||(d.wp.receiveEmbedMessage=function(e){var t=e.data;if((t||t.secret||t.message||t.value)&&!\/[^a-zA-Z0-9]\/.test(t.secret)){for(var s,r,n,a=l.querySelectorAll('iframe[data-secret=\"'+t.secret+'\"]'),o=l.querySelectorAll('blockquote[data-secret=\"'+t.secret+'\"]'),c=new RegExp(\"^https?:$\",\"i\"),i=0;i<o.length;i++)o[i].style.display=\"none\";for(i=0;i<a.length;i++)s=a[i],e.source===s.contentWindow&&(s.removeAttribute(\"style\"),\"height\"===t.message?(1e3<(r=parseInt(t.value,10))?r=1e3:~~r<200&&(r=200),s.height=r):\"link\"===t.message&&(r=new URL(s.getAttribute(\"src\")),n=new URL(t.value),c.test(n.protocol))&&n.host===r.host&&l.activeElement===s&&(d.top.location.href=t.value))}},d.addEventListener(\"message\",d.wp.receiveEmbedMessage,!1),l.addEventListener(\"DOMContentLoaded\",function(){for(var e,t,s=l.querySelectorAll(\"iframe.wp-embedded-content\"),r=0;r<s.length;r++)(t=(e=s[r]).getAttribute(\"data-secret\"))||(t=Math.random().toString(36).substring(2,12),e.src+=\"#?secret=\"+t,e.setAttribute(\"data-secret\",t)),e.contentWindow.postMessage({message:\"ready\",secret:t},\"*\")},!1)))}(window,document);\n\/* ]]> *\/\n<\/script>\n","thumbnail_url":"https:\/\/www.ecinews.fr\/wp-content\/uploads\/import\/default\/files\/import\/thumbnail134x115-13.gif","thumbnail_width":103,"thumbnail_height":96,"description":"Renesas Electronics Europe a annonc\u00e9 avoir re\u00e7u la certification VDE pour son logiciel d'autotest compatible IEC60335 et destin\u00e9 aux familles de microcontr\u00f4leur (MCU) RX600 et RL78. Ces nouvelles routines logicielles d'autotest CPU d\u00e9velopp\u00e9es pour les familles RX600 et RL78 sont pleinement compatibles avec les sp\u00e9cifications IEC60730-1 et ont \u00e9t\u00e9 certifi\u00e9es par le VDE qui est largement reconnu pour sa forte implication concernant les standards de s\u00e9curit\u00e9 et leurs homologations."}