{"version":"1.0","provider_name":"EENewsEurope","provider_url":"https:\/\/www.ecinews.fr\/fr\/","author_name":"Alain Dieul","author_url":"https:\/\/www.ecinews.fr\/fr\/author\/alaindieul\/","title":"Analog Devices r\u00e9volutionne la mesure haute pr\u00e9cision","type":"rich","width":600,"height":338,"html":"<blockquote class=\"wp-embedded-content\" data-secret=\"jSUR3oTuT3\"><a href=\"https:\/\/www.ecinews.fr\/fr\/analog-devices-revolutionne-la-mesure-haute-precision\/\">Analog Devices r\u00e9volutionne la mesure haute pr\u00e9cision<\/a><\/blockquote><iframe sandbox=\"allow-scripts\" security=\"restricted\" src=\"https:\/\/www.ecinews.fr\/fr\/analog-devices-revolutionne-la-mesure-haute-precision\/embed\/#?secret=jSUR3oTuT3\" width=\"600\" height=\"338\" title=\"\u00ab\u00a0Analog Devices r\u00e9volutionne la mesure haute pr\u00e9cision\u00a0\u00bb &#8212; EENewsEurope\" data-secret=\"jSUR3oTuT3\" frameborder=\"0\" marginwidth=\"0\" marginheight=\"0\" scrolling=\"no\" class=\"wp-embedded-content\"><\/iframe><script type=\"text\/javascript\">\n\/* <![CDATA[ *\/\n\/*! This file is auto-generated *\/\n!function(d,l){\"use strict\";l.querySelector&&d.addEventListener&&\"undefined\"!=typeof URL&&(d.wp=d.wp||{},d.wp.receiveEmbedMessage||(d.wp.receiveEmbedMessage=function(e){var t=e.data;if((t||t.secret||t.message||t.value)&&!\/[^a-zA-Z0-9]\/.test(t.secret)){for(var s,r,n,a=l.querySelectorAll('iframe[data-secret=\"'+t.secret+'\"]'),o=l.querySelectorAll('blockquote[data-secret=\"'+t.secret+'\"]'),c=new RegExp(\"^https?:$\",\"i\"),i=0;i<o.length;i++)o[i].style.display=\"none\";for(i=0;i<a.length;i++)s=a[i],e.source===s.contentWindow&&(s.removeAttribute(\"style\"),\"height\"===t.message?(1e3<(r=parseInt(t.value,10))?r=1e3:~~r<200&&(r=200),s.height=r):\"link\"===t.message&&(r=new URL(s.getAttribute(\"src\")),n=new URL(t.value),c.test(n.protocol))&&n.host===r.host&&l.activeElement===s&&(d.top.location.href=t.value))}},d.addEventListener(\"message\",d.wp.receiveEmbedMessage,!1),l.addEventListener(\"DOMContentLoaded\",function(){for(var e,t,s=l.querySelectorAll(\"iframe.wp-embedded-content\"),r=0;r<s.length;r++)(t=(e=s[r]).getAttribute(\"data-secret\"))||(t=Math.random().toString(36).substring(2,12),e.src+=\"#?secret=\"+t,e.setAttribute(\"data-secret\",t)),e.contentWindow.postMessage({message:\"ready\",secret:t},\"*\")},!1)))}(window,document);\n\/* ]]> *\/\n<\/script>\n","thumbnail_url":"https:\/\/www.ecinews.fr\/wp-content\/uploads\/import\/default\/files\/sites\/default\/files\/images\/eci8224_analog_devices.jpg","thumbnail_width":1200,"thumbnail_height":861,"description":"Avec le lancement de MeasureWare, un nouvel ensemble plug and play de kits de mesure mat\u00e9riels et d\u2019outils logiciels (Software Studio), Analog Devices Inc. aide les utilisateurs \u00e0 mieux interpr\u00e9ter leur environnement. Cette plateforme permet de mieux r\u00e9pondre aux exigences de mesure haute pr\u00e9cision qui caract\u00e9risent de nombreux secteurs industriels, parmi lesquels l\u2019agriculture de pr\u00e9cision, la surveillance de l\u2019\u00e9tat des machines, ou l'\u00e9lectrochimie. Avec sa suite MeasureWare, ADI met son exp\u00e9rience des domaines de l\u2019ing\u00e9nierie \u00e9lectronique au service des utilisateurs qui doivent s\u2019appuyer sur des donn\u00e9es pertinentes en temps r\u00e9el, mais qui ne disposent ni du temps ni de l\u2019expertise n\u00e9cessaires pour \u00ab dig\u00e9rer \u00bb des fiches techniques ou d\u00e9velopper des microprogrammes complexes."}